Parameter extraction of single electron transistor based on Master Equation approach

L. Sheela, S. Sudha, N. Balamurugan
{"title":"Parameter extraction of single electron transistor based on Master Equation approach","authors":"L. Sheela, S. Sudha, N. Balamurugan","doi":"10.1109/ICEVENT.2013.6496581","DOIUrl":null,"url":null,"abstract":"In this paper, single electron transistor is modeled using Master Equation (ME) approach. In our scheme the steady state Master Equation was expressed, in which the resultant value is necessary for the current calculation. A ME for the probability distribution of electrons in the SET dot is obtained from the stoachastic process, allowing the calculation of device characteristics. Helmholtz's free energy is considered to determine the transport of electrons through a SET device. Work done by voltage source and free energy change is calculated to get improved IV characteristics of SET.","PeriodicalId":6426,"journal":{"name":"2013 International Conference on Emerging Trends in VLSI, Embedded System, Nano Electronics and Telecommunication System (ICEVENT)","volume":"44 1","pages":"1-5"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 International Conference on Emerging Trends in VLSI, Embedded System, Nano Electronics and Telecommunication System (ICEVENT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEVENT.2013.6496581","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

In this paper, single electron transistor is modeled using Master Equation (ME) approach. In our scheme the steady state Master Equation was expressed, in which the resultant value is necessary for the current calculation. A ME for the probability distribution of electrons in the SET dot is obtained from the stoachastic process, allowing the calculation of device characteristics. Helmholtz's free energy is considered to determine the transport of electrons through a SET device. Work done by voltage source and free energy change is calculated to get improved IV characteristics of SET.
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基于主方程法的单电子晶体管参数提取
本文采用主方程(ME)方法对单电子晶体管进行建模。在我们的方案中,稳态主方程被表示出来,其中的结果值是当前计算所必需的。从随机过程中获得了SET点中电子概率分布的ME,从而可以计算器件特性。亥姆霍兹自由能被认为决定了电子通过SET器件的输运。通过计算电压源所做的功和自由能的变化,得到改进后的SET的IV特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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