Development of bonding process for flexible devices with fine-pitch interconnection using Anisotropic Solder Paste and Laser-Assisted Bonding Technology

Jiho Joo, Y. Eom, Ki-seok Jang, Gwang-Mun Choi, Kwang-Seong Choi
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引用次数: 3

Abstract

We bonded 70μm-thick Si chip and PI substrate with anisotropic solder paste (ASP) using laser-assisted bonding (LAB). ASP contains 5 vol.% of Sn/58Bi type 5, 6 vol.% of nonconductive PMMA balls with diameter of 20μm and thermosetting resin. We have applied ASP on the metal pattern on PI substrate. We have aligned the 70μm-thick Si chip on the PI substrate, and applied pressure to keep the bond line thickness uniform. Then, homogenized laser of which wavelength is 980nm, was irradiated on the Si chip for 5 seconds. When the laser is irradiated to the Si chip, the Si absorbs the laser and its temperature rises. Due to the high thermal conductivity of the Si and electrodes, the heat flux is concentrated on the electrode. Thus selective-solder joint is formed only between the electrodes of the chip and substrate. After the bonding process, we have cured bonded devices at 80°C for 2 hours. Measured contact resistance was ~0.03˟. There were no vaporized substances during the LAB process and the cleaning process is not necessary because the ASP contains no conventional flux and solvent.
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利用各向异性锡膏和激光辅助键合技术开发柔性器件细间距互连的键合工艺
采用激光辅助键合(LAB)技术,利用各向异性锡膏(ASP)将70μm厚的Si芯片与PI衬底进行了键合。ASP中含有5vol .% Sn/58Bi型5vol .%直径为20μm的不导电PMMA球和热固性树脂。我们在PI基板上的金属图案上应用了ASP。我们将70μm厚的Si芯片对准PI衬底,并施加压力以保持键合线厚度均匀。然后,波长为980nm的均匀激光照射在硅片上5秒。当激光照射到硅晶片上时,硅晶片吸收激光,硅晶片的温度升高。由于硅和电极的高导热性,热流集中在电极上。因此,仅在芯片和衬底的电极之间形成选择性焊点。粘合过程完成后,我们将粘合的器件在80°C下固化2小时。测得接触电阻为~0.03˟。由于ASP不含常规助焊剂和溶剂,因此在LAB过程中没有蒸发物质,也不需要清洗过程。
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