Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control

S. Subhechha, N. Rassoul, A. Belmonte, H. Hody, H. Dekkers, Michiel J. van Setten, A. Chasin, S. H. Sharifi, K. Banerjee, H. Puliyalil, S. Kundu, M. Pak, D. Tsvetanova, N. Bazzazian, K. Vandersmissen, D. Batuk, J. Geypen, J. Heijlen, R. Delhougne, G. Kar
{"title":"Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control","authors":"S. Subhechha, N. Rassoul, A. Belmonte, H. Hody, H. Dekkers, Michiel J. van Setten, A. Chasin, S. H. Sharifi, K. Banerjee, H. Puliyalil, S. Kundu, M. Pak, D. Tsvetanova, N. Bazzazian, K. Vandersmissen, D. Batuk, J. Geypen, J. Heijlen, R. Delhougne, G. Kar","doi":"10.1109/icicdt56182.2022.9933087","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6737,"journal":{"name":"2021 International Conference on IC Design and Technology (ICICDT)","volume":"1 1","pages":"88"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 International Conference on IC Design and Technology (ICICDT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/icicdt56182.2022.9933087","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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基于缺陷控制的IGZO门控TFTs性能提升器件工程指南
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