Coulomb blockade electrometer based on single Cooper pair tunneling

A.B. Zorin , Yu.A. Pashkin , V.A. Krupenin , H. Scherer
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引用次数: 1

Abstract

We have studied the electrometric characteristics of the Bloch transistor, i.e. the structure comprising a double small-capacitance superconductor junction (where both the Josephson and the charging energies, EJ1,2EC1,2kBT) and an adjacent gate electrode polarizing its island. The transistor bias is realized through small-sized high-ohmic resistors (≫RQ=h/4e2≈6.5 kΩ) to ensure a high electromagnetic impedance of the transistor environment. At low bias current, a coherent flow of single Cooper pairs occurs and the average voltage across the transistor shows a 2e-periodic dependence on the polarization charge Q0. The sensitivity of such an electrometer has been evaluated and found to be comparable to that of the single-electron counterpart. The device has been fabricated with Al/AlOx/Al junctions and two miniature on-chip Cr resistors (each of 80 kΩ and 10 μm long) which were located very close to the junctions. We used this device to measure 1/f noise of the background charge and found it to be about 9×10−4 e/Hz1/2 at 10 Hz.

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基于单库珀对隧穿的库仑阻断静电计
本文研究了Bloch晶体管的电测特性,即由双小电容超导体结(其中Josephson和充电能量都在ej1,2∽ec1,2 ~ kBT)和相邻的栅极极化其岛组成的结构。晶体管的偏置是通过小尺寸的高欧姆电阻(r2 =h/4e2≈6.5 kΩ)来实现的,保证了晶体管环境的高电磁阻抗。在低偏置电流下,单个库珀对的相干流动发生,晶体管上的平均电压与极化电荷Q0呈2e周期依赖关系。这种静电计的灵敏度已被评估,并发现可与单电子对应物相媲美。该器件由Al/AlOx/Al结和两个非常靠近结的微型片上Cr电阻(每个80 kΩ和10 μm长)制成。我们使用该装置测量了背景电荷的1/f噪声,发现它在10 Hz时约为9×10−4 e/Hz1/2。
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