Shear creep behavior of Sn-3Ag-0.5Cu solder bumps in ball grid array

B. An, G. Gu, Wenfei Zhang, Yiping Wu
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引用次数: 2

Abstract

A precise creep tester was established to in situ measure the micro strain of the solder under different temperatures and certain loads. The ball grid array samples with the diameter of 0.76 mm Sn-3Ag-0.5Cu (SAC305) solder bumps were tested under the shear strength ranged from 7 MPa up to 14 MPa and the heating temperatures from 24°C up to 100°C. Creep constitutive equation of the steady-state creep, together with its stress exponent n, creep activation energy Q and structure constant A were determined by employing the power law creep. The coarsening Ag3Sn particles were observed with the temperature rising up under a certain load.
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Sn-3Ag-0.5Cu钎料凸点在球栅阵列中的剪切蠕变行为
建立了精密蠕变试验装置,用于现场测量不同温度和一定载荷下焊料的微应变。对直径为0.76 mm的Sn-3Ag-0.5Cu (SAC305)焊点球栅阵列样品在7 ~ 14 MPa的剪切强度范围和24 ~ 100℃的加热温度下进行了测试。采用幂律蠕变法确定了稳态蠕变的蠕变本构方程及其应力指数n、蠕变活化能Q和结构常数A。在一定载荷下,随着温度的升高,Ag3Sn颗粒逐渐粗化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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