A. Kawasumi, Y. Takeyama, O. Hirabayashi, K. Kushida, F. Tachibana, Y. Niki, S. Sasaki, T. Yabe
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引用次数: 12
Abstract
A variation tolerant sense amplifier timing generator which utilizes a statistical method is proposed. The circuit monitors all the bitline delays and generates the worst timing from the delay distribution. The proposed timing generators have been implemented in 28nm and 40nm SRAMs. The 47% access time reduction has been confirmed in measured results.
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