An Application of Adaptive Genetic Algorithm Combining Monte Carlo Method

Wei Yu, Xu Chen, Jing-fen Lu, Zhengying Wei
{"title":"An Application of Adaptive Genetic Algorithm Combining Monte Carlo Method","authors":"Wei Yu, Xu Chen, Jing-fen Lu, Zhengying Wei","doi":"10.1109/CSTIC49141.2020.9282583","DOIUrl":null,"url":null,"abstract":"We show the feasibility of this algorithm in finding tool commonality with N=10. Actually, we have experimented on different values of N. The value of each parameter is shown in Table I. Specially, we fixed β to be 1.0 in this section. As shown in Table II and Fig. 3, the performance actually gets better when we repeated the model for more times. However, the improvement is not significant. With the increase of N, the number of true positive alarms is steady while the number of false positive alarms decreased a little bit. To be specific, when N inclines from 5 to 10, the number of false positive alarms declines from 3 to 2, which, in turn, results in a slight increase of F1 score. There is no variation when N changes from 10 to 15. The trend when N grows from 15 to 20 is similar to the trend from 5 to 10. Taking the cost of computation into consideration, we finally chose N to be 10.","PeriodicalId":6848,"journal":{"name":"2020 China Semiconductor Technology International Conference (CSTIC)","volume":"14 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 China Semiconductor Technology International Conference (CSTIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC49141.2020.9282583","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

We show the feasibility of this algorithm in finding tool commonality with N=10. Actually, we have experimented on different values of N. The value of each parameter is shown in Table I. Specially, we fixed β to be 1.0 in this section. As shown in Table II and Fig. 3, the performance actually gets better when we repeated the model for more times. However, the improvement is not significant. With the increase of N, the number of true positive alarms is steady while the number of false positive alarms decreased a little bit. To be specific, when N inclines from 5 to 10, the number of false positive alarms declines from 3 to 2, which, in turn, results in a slight increase of F1 score. There is no variation when N changes from 10 to 15. The trend when N grows from 15 to 20 is similar to the trend from 5 to 10. Taking the cost of computation into consideration, we finally chose N to be 10.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
自适应遗传算法结合蒙特卡罗方法的应用
我们证明了该算法在N=10时寻找工具共性的可行性。实际上,我们对不同的n值进行了实验,各参数的值如表1所示。在本节中,我们将β固定为1.0。如表2和图3所示,我们重复模型的次数越多,性能就越好。然而,这种改善并不显著。随着N的增加,真阳性报警数量保持稳定,而假阳性报警数量略有减少。具体来说,当N从5向10倾斜时,误报次数从3次减少到2次,进而导致F1分数略有提高。当N从10到15变化时,没有变化。N从15增加到20时的趋势与5增加到10时的趋势相似。考虑到计算成本,我们最终选择N为10。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Effect of Bonded Ball Shape on Gold Wire Bonding Quality Based on ANSYS/LS-DYNA Simulation Optimization on Deposition of Aluminum Nitride by Pulsed Direct Current Reactive Magnetron Sputtering A Novel Vertical Closed-Loop Control Method for High Generation TFT Lithography Machine Surface Smoothing and Roughening Effects of High-K Dielectric Materials Deposited by Atomic Layer Deposition and Their Significance for MIM Capacitors Used in Dram Technology Part II A Simulation Study for Typical Design Rule Patterns and Stochastic Printing Failures in a 5 nm Logic Process with EUV Lithography
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1