In-depth feasibility study of extreme ultraviolet damascene extension: Patterning, dielectric etch, and metallization

IF 1.4 4区 工程技术 Journal of Vacuum Science & Technology B Pub Date : 2022-03-01 DOI:10.1116/6.0001671
Xinghua Sun, Y. Mignot, Christopher Cole, E. Liu, Daniel Santos, Angélique Raley, Jennifer Church, Luciana Meli, S. Sieg, P. Biolsi
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来源期刊
Journal of Vacuum Science & Technology B
Journal of Vacuum Science & Technology B 工程技术-工程:电子与电气
自引率
14.30%
发文量
0
审稿时长
2.5 months
期刊介绍: Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.
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