Conformal photoresist coating for critical dimension improvement

L. Supadee, W. Titiroongruang
{"title":"Conformal photoresist coating for critical dimension improvement","authors":"L. Supadee, W. Titiroongruang","doi":"10.1109/INEC.2010.5424787","DOIUrl":null,"url":null,"abstract":"3D surface topography of read / write head fabrication is difficult for lithography process. Photoresist deposition by using the conventional spin coating method is troubled. Spray coating is a replacement technique that eliminates the problem by producing micro-resist droplets that adhere firmly to the deposition location; thus, spray coating with optimal parameters from designed experiment is a suitable method for photoresist deposition on structures with high aspect ratio. By using proper nitrogen flow rate to spread out AZ4999 resist to be micro-droplet in the same time with proper traveling nozzle speed, the photoresist turbulence will perform good resist coverage over all surfaces. From design of experiment show the optimum condition for conformal deposition is 0.8 Bar at 117mm/s for nitrogen pressure and nozzle speed, respectively. Photoresist thickness was dropped at 30um far away from groove or edge of the head.","PeriodicalId":6390,"journal":{"name":"2010 3rd International Nanoelectronics Conference (INEC)","volume":"29 1","pages":"454-455"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 3rd International Nanoelectronics Conference (INEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INEC.2010.5424787","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

3D surface topography of read / write head fabrication is difficult for lithography process. Photoresist deposition by using the conventional spin coating method is troubled. Spray coating is a replacement technique that eliminates the problem by producing micro-resist droplets that adhere firmly to the deposition location; thus, spray coating with optimal parameters from designed experiment is a suitable method for photoresist deposition on structures with high aspect ratio. By using proper nitrogen flow rate to spread out AZ4999 resist to be micro-droplet in the same time with proper traveling nozzle speed, the photoresist turbulence will perform good resist coverage over all surfaces. From design of experiment show the optimum condition for conformal deposition is 0.8 Bar at 117mm/s for nitrogen pressure and nozzle speed, respectively. Photoresist thickness was dropped at 30um far away from groove or edge of the head.
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用于关键尺寸改进的保形光刻胶涂层
读写头的三维表面形貌是光刻工艺的难点。采用传统的旋涂法沉积光刻胶存在一定的问题。喷涂是一种替代技术,通过产生牢固粘附在沉积位置的微抗蚀剂液滴来消除问题;因此,采用实验设计的最优参数进行喷涂是在高纵横比结构上制备光刻胶的合适方法。通过适当的氮气流量,在适当的喷嘴速度下,将AZ4999抗蚀剂同时扩散成微液滴,光刻胶湍流可以在所有表面上实现良好的抗蚀剂覆盖。实验设计表明,在氮气压力和喷嘴速度下,适形沉积的最佳条件为0.8 Bar,速率为117mm/s。光刻胶厚度在远离凹槽或头部边缘30um处下降。
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