J. Auleytner, J. Bąk-Misiuk, Z. Furmanik, J. Morawiec
{"title":"On the Possibility of Application of X-ray Diffraction Edge Contrast for the Quantitative Determination of High-energy Heavy Ion Range in Silicon","authors":"J. Auleytner, J. Bąk-Misiuk, Z. Furmanik, J. Morawiec","doi":"10.1515/9783112485606-023","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":14710,"journal":{"name":"January","volume":"47 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"1988-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"January","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/9783112485606-023","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
