iNEMI solder paste deposition project - First stage review optimizing solder paste printing for large and small components

Shoukai Zhang, R. Mohanty, Xiaodong Jiang, R. Mao, J. Lee, Chuan Xia, K. Sweatman, D. Teoh
{"title":"iNEMI solder paste deposition project - First stage review optimizing solder paste printing for large and small components","authors":"Shoukai Zhang, R. Mohanty, Xiaodong Jiang, R. Mao, J. Lee, Chuan Xia, K. Sweatman, D. Teoh","doi":"10.1109/IMPACT.2009.5382261","DOIUrl":null,"url":null,"abstract":"The widely recognized industry standard IPC-7525 has been used as the starting point for an experimental program that explores the effect of varying the keep out distance for 0201 and 0402 chip components, CSP and SOP with pitches down to 0.4mm, and larger components represented by CCGA. Other variables that were included in the experimental program to determine if they had an effect on the sensitivity of paste transfer to keep-out distance included stencil type, step height and solder type. In the first stage of the project the printing to each pad was measured with automated 3D SPI systems and optimum combinations of parameters identified by statistical analysis. In this paper the authors will explain the methodology chosen to achieve the project objectives and indicate the direction of likely future work. Early results indicate that a key objective of the project, to provide evidence to support the case for a reduction in the keep out","PeriodicalId":6410,"journal":{"name":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","volume":"6 1","pages":"620-623"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMPACT.2009.5382261","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

The widely recognized industry standard IPC-7525 has been used as the starting point for an experimental program that explores the effect of varying the keep out distance for 0201 and 0402 chip components, CSP and SOP with pitches down to 0.4mm, and larger components represented by CCGA. Other variables that were included in the experimental program to determine if they had an effect on the sensitivity of paste transfer to keep-out distance included stencil type, step height and solder type. In the first stage of the project the printing to each pad was measured with automated 3D SPI systems and optimum combinations of parameters identified by statistical analysis. In this paper the authors will explain the methodology chosen to achieve the project objectives and indicate the direction of likely future work. Early results indicate that a key objective of the project, to provide evidence to support the case for a reduction in the keep out
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
iNEMI锡膏沉积项目-第一阶段审查优化大型和小型组件的锡膏印刷
广泛认可的行业标准IPC-7525已被用作实验程序的起点,该实验程序探索了0201和0402芯片组件,CSP和SOP的间距低至0.4mm以及以CCGA为代表的更大组件的变化保持距离的影响。其他变量包括在实验程序中,以确定它们是否对膏体转移对保持距离的敏感性有影响,包括模板类型,台阶高度和焊料类型。在项目的第一阶段,通过自动3D SPI系统和统计分析确定的最佳参数组合来测量每个垫的打印。在本文中,作者将解释为实现项目目标而选择的方法,并指出可能的未来工作方向。早期的结果表明,该项目的一个关键目标是提供证据来支持减少拒之门外的情况
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Estimation design of MEMS-based inertial navigation systems with noise coupling input saturation: Robust approach Experimental investigation and finite element analysis of bump wafer probing Optimum design of contact springs used in registered jack connectors Optimization design of cup-shaped copper heat spreaders for high-power InGaN/sapphire LEDs The high performance electrodeposited copper foil for next generation
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1