A Novel Design of High-Temperature Lead-Free Solders for Die-Attachment in Power Discrete Applications

HongWen Zhang, Samuel Lytwynec, Huaguang Wang, J. Geng, Francis Mutuku, N. Lee
{"title":"A Novel Design of High-Temperature Lead-Free Solders for Die-Attachment in Power Discrete Applications","authors":"HongWen Zhang, Samuel Lytwynec, Huaguang Wang, J. Geng, Francis Mutuku, N. Lee","doi":"10.4071/1085-8024-2021.1.000356","DOIUrl":null,"url":null,"abstract":"\n Development of high-temperature lead-free (HTLF) solders to replace high-lead solders for die-attachment in power device applications is driven by (1) the harmful effects of lead to human health and the environment, and (2) the demand of the improved bonding materials serving under high-power density and high-junction temperatures, especially for wide-band-gap power devices. A novel design, based on a mixed solder powder paste technology—Durafuse™—has been developed to deliver a Sn-rich HTLF paste, presenting the merits of both constituent powders. The combination of the rigid, high-melting SnSbCuAgX and the ductile, low-temperature Sn-rich solder in one paste enables reflow at a relatively low temperature (barely above the liquidus temperature of the final joint composition) and maintains the joint strength above 15MPa in the temperature range between 270°C and 295°C. The sufficient high-temperature strength has demonstrated the capability of maintaining the joint integrity during subsequent multiple SMT reflows below the 270°C peak temperature, regardless of the existence of a partial melting phase. Both X-ray inspection and cross-section microstructure have not shown any damage in the Si die or any noticeable cracks in the bonding joint, even after 3000 cycles of TCT (−40 to 150°C). In summary, Durafuse™ HT, the novel design of the high-temperature lead-free pastes, has shown the feasibility as a drop-in solution to replace high-lead solders for die-attachment in power discrete applications.","PeriodicalId":14363,"journal":{"name":"International Symposium on Microelectronics","volume":"155 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Microelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4071/1085-8024-2021.1.000356","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Development of high-temperature lead-free (HTLF) solders to replace high-lead solders for die-attachment in power device applications is driven by (1) the harmful effects of lead to human health and the environment, and (2) the demand of the improved bonding materials serving under high-power density and high-junction temperatures, especially for wide-band-gap power devices. A novel design, based on a mixed solder powder paste technology—Durafuse™—has been developed to deliver a Sn-rich HTLF paste, presenting the merits of both constituent powders. The combination of the rigid, high-melting SnSbCuAgX and the ductile, low-temperature Sn-rich solder in one paste enables reflow at a relatively low temperature (barely above the liquidus temperature of the final joint composition) and maintains the joint strength above 15MPa in the temperature range between 270°C and 295°C. The sufficient high-temperature strength has demonstrated the capability of maintaining the joint integrity during subsequent multiple SMT reflows below the 270°C peak temperature, regardless of the existence of a partial melting phase. Both X-ray inspection and cross-section microstructure have not shown any damage in the Si die or any noticeable cracks in the bonding joint, even after 3000 cycles of TCT (−40 to 150°C). In summary, Durafuse™ HT, the novel design of the high-temperature lead-free pastes, has shown the feasibility as a drop-in solution to replace high-lead solders for die-attachment in power discrete applications.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
一种用于电源分立应用的高温无铅焊料的新设计
开发高温无铅焊料取代高铅焊料用于功率器件的模具连接,主要是由于:(1)铅对人体健康和环境的有害影响,以及(2)改进的键合材料在高功率密度和高结温下的需求,特别是用于宽带隙功率器件。一种基于混合锡粉膏技术durafuse™的新设计已经开发出来,可以提供富含锡的HTLF膏体,同时呈现两种成分粉末的优点。刚性、高熔点的SnSbCuAgX和延展性、低温富锡焊料结合在一个膏体中,可以在相对较低的温度(略高于最终接头成分的液相温度)下回流,并在270°C至295°C的温度范围内保持接头强度在15MPa以上。足够的高温强度证明了在270℃峰值温度以下的后续多次SMT回流中保持接头完整性的能力,无论是否存在部分熔化阶段。x射线检查和横截面显微结构均未显示Si模的任何损伤或接合处的任何明显裂纹,即使经过3000次TCT循环(- 40至150°C)。总之,Durafuse™HT是一种新颖的高温无铅浆料设计,作为一种可替代高铅焊料的解决方案,可用于电源分立应用的模具连接。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Advanced Packaging Technology for Novel 1-dimensional and 2-dimensional VCSEL Arrays The Pivotal Role of Uniformity of Electrolytic Deposition Processes to Improve the Reliability of Advanced Packaging Enhancing the Paste Release on 55μm pads with Water-Soluble Type 7 SAC305 Solder Paste for High Density SIP Application Coronavirus, chip boom, and supply shortage: The new normal for global semiconductor manufacturing Lithography Solutions for Submicron Panel-Level Packaging
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1