Combined peridynamic theory and kinetic theory of fracture for solder joint fatigue life prediction

E. Madenci, C. Diyaroglu, Y. Zhang, F. Baber, I. Guven
{"title":"Combined peridynamic theory and kinetic theory of fracture for solder joint fatigue life prediction","authors":"E. Madenci, C. Diyaroglu, Y. Zhang, F. Baber, I. Guven","doi":"10.1109/ectc32862.2020.00049","DOIUrl":null,"url":null,"abstract":"This study presents an approach that combines the kinetic theory of fracture with peridynamic theory to predict solder joint fatigue life in electronic packages. It is applied to two different package types whose measured life values are reported in literature. The nonlinear finite element analyses of the global package model and sub-model of the critical joint provide the boundary conditions for the peridynamic model. Both the finite element and peridynamic analyses are performed in the ANSYS framework by using the available elements and options. This new approach captures the experimentally observed damage topology in a solder joint. Although the initial and final fatigue life predictions are acceptable, the predictions can certainly be improved with accurate values of activation energy and activation volume for materials employed in the package.","PeriodicalId":6722,"journal":{"name":"2020 IEEE 70th Electronic Components and Technology Conference (ECTC)","volume":"77 1","pages":"236-248"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 70th Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ectc32862.2020.00049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

This study presents an approach that combines the kinetic theory of fracture with peridynamic theory to predict solder joint fatigue life in electronic packages. It is applied to two different package types whose measured life values are reported in literature. The nonlinear finite element analyses of the global package model and sub-model of the critical joint provide the boundary conditions for the peridynamic model. Both the finite element and peridynamic analyses are performed in the ANSYS framework by using the available elements and options. This new approach captures the experimentally observed damage topology in a solder joint. Although the initial and final fatigue life predictions are acceptable, the predictions can certainly be improved with accurate values of activation energy and activation volume for materials employed in the package.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
结合围动力学理论和断裂动力学理论进行焊点疲劳寿命预测
提出了一种结合断裂动力学理论和动态动力学理论预测电子封装焊点疲劳寿命的方法。它适用于两种不同的包装类型,其测量寿命值在文献中报道。对整体包体模型和临界接头子模型的非线性有限元分析为环动力模型提供了边界条件。在ANSYS框架中利用可用的单元和选项进行有限元和周动力分析。这种新方法捕获了实验中观察到的焊点损伤拓扑。虽然初始和最终的疲劳寿命预测是可以接受的,但对于包装中使用的材料,可以通过准确的活化能和活化体积值来改进预测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Thermal aging reliability of socketable, surface-modified solder BGAs with and without polymer collars Plating-free Bumping by Cu Nanopaste and Injection Molded Solder (IMS) for Fine Pitch Flip Chip Joining Photosensitive polymer reliability for fine pitch RDL applications Characterization and Application of a Novel Permanent Bonding Material ECTC 2020 Breaker Page
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1