Velocity distribution function of hydrogen atoms in ion source discharges

Tatsuhiro Tokai, Y. Shimabukuro, Hidenori Takahashi, Keita Bito, M. Wada
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Abstract

The efficiency of negative hydrogen (H−) ion surface production in an ion source should be highly dependent upon the velocity distribution of atomic hydrogen (H0) striking the extraction electrode. A measurement system to observe the change in the H0 velocity distribution functions depending upon the method to excite the plasma has been designed, built and, is having its performance improved. The system equips a rotating blade neutral beam chopper to modulate the intensity of the neutral flux passing through the skimmer that separates the downstream chamber for time-of-flight analysis from the ion source discharge. After about 45 cm free flying vacuum space an electron impact type ionizer converts neutral particles to positive ions. A magnetic deflection type mass separator guides the produced protons and molecular ions to a secondary electron multiplier detector. The system demonstrated the existence of a high-speed component in the H0 time-of-flight (ToF) spectrum when it was tested with an ECR plasma source. Although the temperature change of hydrogen atoms obtained from the ToF spectra and that of hydrogen molecules were unclear, some hint of the particle acceleration due to discharge was observed.
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离子源放电中氢原子的速度分布函数
离子源表面产生负氢离子(H−)的效率应高度依赖于原子氢(H0)撞击提取电极的速度分布。设计、构建了一套测量系统,用于观察等离子体激发方式对H0速度分布函数的影响,并不断改进其性能。该系统配备了一个旋转叶片中性束斩波器,以调节通过撇浪器的中性通量的强度,撇浪器将用于飞行时间分析的下游腔室与离子源放电分开。在大约45厘米的自由飞行真空空间后,电子撞击型电离器将中性粒子转化为正离子。磁偏转型质量分离器将所产生的质子和分子离子引导到二级电子倍增器检测器。在ECR等离子体源的测试中,该系统证明了在H0飞行时间(ToF)频谱中存在高速组件。虽然从ToF光谱中得到的氢原子的温度变化和氢分子的温度变化不太清楚,但观察到一些由于放电引起的粒子加速的迹象。
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