The Digital Twin: Virtual Validation In Electronics Development And Design

Dwight Howard
{"title":"The Digital Twin: Virtual Validation In Electronics Development And Design","authors":"Dwight Howard","doi":"10.23919/PANPACIFIC.2019.8696712","DOIUrl":null,"url":null,"abstract":"Product development is increasingly challenging. Competition demands that ideas be evolved from concept to products shipping into the marketplace in the shortest possible time. Markets are demanding more from technologies. To meet these demands, engineers must utilize the most advanced capabilities that are available. Engineers must minimize time and cost to speed design, development, validation and release to manufacturing. increasing complexities in physical products. Electronics has led the way in feature growth and complexities. Additionally, software magnifies complexities exponentially. Traditional methods of bringing products from concept to production cannot provide the means engineers need to meet the challenges. Computer-based models of physical hardware are critical to meeting current and future challenges. This presentation discusses the promise of the so-called “Digital Twin” and how it may facilitate virtual validation of hardware to facilitate rapid development at least cost in time and manpower while achieving optimized designs by way of “virtual validation”. Discussion regarding digital twins has risen to the forefront as the way of the future. This paper will also identify primary challenges that proponents and visionaries of this concept have cited as the major hurtles that must be overcome.","PeriodicalId":6747,"journal":{"name":"2019 Pan Pacific Microelectronics Symposium (Pan Pacific)","volume":"26 1","pages":"1-9"},"PeriodicalIF":0.0000,"publicationDate":"2019-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 Pan Pacific Microelectronics Symposium (Pan Pacific)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/PANPACIFIC.2019.8696712","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17

Abstract

Product development is increasingly challenging. Competition demands that ideas be evolved from concept to products shipping into the marketplace in the shortest possible time. Markets are demanding more from technologies. To meet these demands, engineers must utilize the most advanced capabilities that are available. Engineers must minimize time and cost to speed design, development, validation and release to manufacturing. increasing complexities in physical products. Electronics has led the way in feature growth and complexities. Additionally, software magnifies complexities exponentially. Traditional methods of bringing products from concept to production cannot provide the means engineers need to meet the challenges. Computer-based models of physical hardware are critical to meeting current and future challenges. This presentation discusses the promise of the so-called “Digital Twin” and how it may facilitate virtual validation of hardware to facilitate rapid development at least cost in time and manpower while achieving optimized designs by way of “virtual validation”. Discussion regarding digital twins has risen to the forefront as the way of the future. This paper will also identify primary challenges that proponents and visionaries of this concept have cited as the major hurtles that must be overcome.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
数字孪生:电子产品开发与设计中的虚拟验证
产品开发的挑战越来越大。竞争要求在尽可能短的时间内将想法从概念演变为产品并推向市场。市场对技术的要求越来越高。为了满足这些需求,工程师必须利用最先进的能力。工程师必须尽量减少时间和成本,以加快设计,开发,验证和发布到制造。实体产品日益复杂。电子产品在功能增长和复杂性方面处于领先地位。此外,软件成倍地放大了复杂性。将产品从概念到生产的传统方法无法为工程师提供应对挑战所需的手段。基于计算机的物理硬件模型对于应对当前和未来的挑战至关重要。本演讲讨论了所谓的“数字孪生”的承诺,以及它如何促进硬件的虚拟验证,以促进快速开发,同时通过“虚拟验证”实现优化设计。关于数字孪生的讨论已经上升到最前沿,成为未来的方式。本文还将确定该概念的支持者和远见者所引用的主要挑战,这些挑战是必须克服的主要障碍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
New Era of Device Science Reliability Engineering Techniques for Consumer Products I/O Planning and Cross-Hierarchical Optimization for Advanced Electronic “Systems 4.0” Tin Whiskers 101: 2019 Selection and Qualification of a Local Rework Supplier
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1