Failure analysis of (DIMM hole) solder void in lead free process used OSP coated PCB

Liao Meng-Chieh, T. Hai, R. Wang
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引用次数: 2

Abstract

IPC-610D defines the degree of barrel fill in PTH (Planting through hole) into three levels, 25%, 50% and 75%. However, in PCBA stage, when using X-ray to inspect PTH, it is often the case that after wave soldering, there will be solder void. If the size of the solder void accounts the majority size of the PTH, three levels of the IPC-610D is often regarded as the standards for approximate calculation. For instance, during X-ray inspection, if the size of solder void is smaller than 50% size of the PTH, then the product passes the inspection. However, such method is only for estimation purposes instead of precise calculation. Such situation is due to that the number of solder void may be more than one. Moreover, sometimes multiple solder void distribution is possible. It is difficult to analyze the cause of each individual solder void as well as calculate the size of the solder void precisely. Under such complicated circumstances, we focus on the root cause of PTH solder void by failure analysis method. The goal of the analysis is to prevent the occurrence of solder void in advance as well as establish the manufacturing indicators as a bench mark.
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采用OSP涂层PCB无铅工艺中(DIMM孔)焊点空洞的失效分析
IPC-610D将PTH(种植通孔)的筒体填充度定义为25%、50%和75%三个级别。然而,在PCBA阶段,使用x射线检查PTH时,经常会出现波峰焊后出现焊料空洞的情况。如果焊料空洞的尺寸占PTH的大部分尺寸,IPC-610D的三个级别通常被视为近似计算的标准。例如,在x射线检查时,如果焊料空洞的尺寸小于PTH尺寸的50%,则产品通过检查。然而,这种方法只是为了估计,而不是精确的计算。这种情况是由于焊料空洞的数量可能不止一个。此外,有时多个焊料空洞分布是可能的。分析每个单独的焊点空洞的原因以及精确计算焊点空洞的大小是困难的。在这种复杂的情况下,采用失效分析的方法,重点分析PTH焊料空洞产生的根本原因。分析的目的是提前防止焊料空洞的发生,并建立制造指标作为基准。
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