Zheyu Zhang, Fred Wang, L. Tolbert, B. Blalock, D. Costinett
{"title":"Realization of high speed switching of SiC power devices in voltage source converters","authors":"Zheyu Zhang, Fred Wang, L. Tolbert, B. Blalock, D. Costinett","doi":"10.1109/WIPDA.2015.7369272","DOIUrl":null,"url":null,"abstract":"Four factors impact high speed switching of silicon carbide (SiC) devices in voltage source converters, including limited gate driving capability, cross-talk, parasitics associated in switching loop, and parasitics of inductive load. This paper focuses on a solution to mitigate the adverse impact of the aforementioned factors. First, an intelligent gate drive is developed for gate driving capability enhancement and cross-talk suppression. Second, placement and layout design of power devices, gate drive, and power stage board are proposed to minimize parasitics for fast switching and over-voltage mitigation. Third, an auxiliary filter is designed to mitigate the negative impact of inductive load's parasitics during the switching transient. Finally, by utilizing all techniques developed above, a three-phase voltage source inverter with Cree 1200-V/20-A SiC MOSFETs is established. Test results show that the switching behavior of SiC devices in actual three-phase voltage source inverter fed motor drives can mostly repeat the switching performance tested by the optimally-designed double pulse test.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"5 1","pages":"28-33"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WIPDA.2015.7369272","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Four factors impact high speed switching of silicon carbide (SiC) devices in voltage source converters, including limited gate driving capability, cross-talk, parasitics associated in switching loop, and parasitics of inductive load. This paper focuses on a solution to mitigate the adverse impact of the aforementioned factors. First, an intelligent gate drive is developed for gate driving capability enhancement and cross-talk suppression. Second, placement and layout design of power devices, gate drive, and power stage board are proposed to minimize parasitics for fast switching and over-voltage mitigation. Third, an auxiliary filter is designed to mitigate the negative impact of inductive load's parasitics during the switching transient. Finally, by utilizing all techniques developed above, a three-phase voltage source inverter with Cree 1200-V/20-A SiC MOSFETs is established. Test results show that the switching behavior of SiC devices in actual three-phase voltage source inverter fed motor drives can mostly repeat the switching performance tested by the optimally-designed double pulse test.
影响电压源变换器中碳化硅器件高速开关性能的因素有四个:栅极驱动能力有限、串扰、开关回路中的寄生效应和感性负载的寄生效应。本文的重点是一个解决方案,以减轻上述因素的不利影响。首先,为了提高栅极驱动能力和抑制串扰,开发了一种智能栅极驱动器。其次,提出了功率器件、栅极驱动和功率级板的放置和布局设计,以最大限度地减少寄生,实现快速开关和过电压缓解。第三,设计了辅助滤波器,以减轻开关暂态过程中电感负载寄生的负面影响。最后,利用上述所有技术,建立了一个具有Cree 1200 v /20 a SiC mosfet的三相电压源逆变器。测试结果表明,SiC器件在实际三相电压源逆变器馈电电机驱动中的开关性能基本可以重复优化设计的双脉冲测试所测试的开关性能。