Influence of the thickness of frontal platinum metallic layer on the electro-optical characteristics of GaN-based Schottky ultraviolet photodetectors

F. Bouzid, F. Pezzimenti
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Abstract

In this work, we evaluated the effect of the thickness of frontal metallic layer on the electro-optical characteristics of an n-type gallium nitride (n-GaN)-based Schottky barrier ultraviolet (UV) detector using device modeling and numerical simulations. Comparison of the current density-voltage characteristics J(V) calculated for different metals demonstrated that platinum (Pt) is the most suitable metal to form Schottky contacts. The obtained results show that the thickness of the frontal platinum Schottky contact highly affects the spectral responsivity of the detector in the considered UV range of 0.2…0.4 µm. In particular, the detector responsivity at room temperature can reach the peak value of 0.208 A·W–1 at the wavelength of 0.364 µm and the semi-transparent Pt layer as thin as 1 nm. Afterward, it gradually decreases with the increase of the metal layer thickness down to 0.147 A·W–1 for the thickness of the Pt layer of 100 nm.
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正面铂金属层厚度对氮化镓基肖特基紫外光电探测器光电特性的影响
在这项工作中,我们利用器件建模和数值模拟的方法评估了正面金属层厚度对n型氮化镓(n-GaN)基肖特基势垒紫外线(UV)探测器电光特性的影响。比较不同金属的电流密度-电压特性J(V),表明铂(Pt)是最适合形成肖特基触点的金属。结果表明,在考虑的0.2 ~ 0.4µm紫外范围内,正面铂肖特基接触的厚度对探测器的光谱响应度有很大影响。特别是,探测器在室温下的响应率在0.364µm波长处达到峰值0.208 A·W-1,半透明Pt层薄至1 nm。之后,随着金属层厚度的增加,该系数逐渐减小,当Pt层厚度为100 nm时,该系数降至0.147 A·W-1。
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