Analysis on error and tolerance for the wavefront reference source of point diffraction interferometer

代晓珂 Dai Xiao-ke, 金春水 Jin Chunshui, 于杰 Yu Jie
{"title":"Analysis on error and tolerance for the wavefront reference source of point diffraction interferometer","authors":"代晓珂 Dai Xiao-ke, 金春水 Jin Chunshui, 于杰 Yu Jie","doi":"10.3788/CO.20140705.0855","DOIUrl":null,"url":null,"abstract":"To keep the advantages of fiber point diffraction interferometer which is easy to align and control the diffracted light,we design a new wavefront reference source( WRS). WRS can keep the advantages of fiber point diffraction interferometer and pin-hole point diffraction interferometer,and it also can be used to test the wavefront aberration of larger NA optical system for Extreme Ultraviolet Lithography( EUVL). The analysis of error for this new WRS and calibration of the system error is very important for realizing a more accurate test of wavefront aberration. Based on the analysis of various errors,we study the calibration algorithm in detail,and obtain the tolerance of several WRS important components including that the angle tolerance of rotation stage is0. 5° and the deviation factor is 0. 5% when rotation is away optical axis.","PeriodicalId":10133,"journal":{"name":"Chinese Journal of Optics and Applied Optics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Chinese Journal of Optics and Applied Optics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3788/CO.20140705.0855","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

To keep the advantages of fiber point diffraction interferometer which is easy to align and control the diffracted light,we design a new wavefront reference source( WRS). WRS can keep the advantages of fiber point diffraction interferometer and pin-hole point diffraction interferometer,and it also can be used to test the wavefront aberration of larger NA optical system for Extreme Ultraviolet Lithography( EUVL). The analysis of error for this new WRS and calibration of the system error is very important for realizing a more accurate test of wavefront aberration. Based on the analysis of various errors,we study the calibration algorithm in detail,and obtain the tolerance of several WRS important components including that the angle tolerance of rotation stage is0. 5° and the deviation factor is 0. 5% when rotation is away optical axis.
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点衍射干涉仪波前参考源误差及容限分析
为了保持光纤点衍射干涉仪易于对准和控制衍射光的优点,设计了一种新的波前参考源(WRS)。WRS既保留了光纤点衍射干涉仪和针孔点衍射干涉仪的优点,又可用于极紫外光刻(EUVL)中较大NA光学系统的波前像差测试。该系统的误差分析和系统误差的标定对于实现更精确的波前像差测试至关重要。在对各种误差进行分析的基础上,详细研究了WRS的标定算法,得到了WRS旋转台角度公差为0等几个重要部件的标定误差。5°,偏差系数为0。当旋转远离光轴时5%。
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