{"title":"Micrometrie displacement sensor based on chipless RFID","authors":"E. Perret","doi":"10.1109/MWSYM.2017.8058640","DOIUrl":null,"url":null,"abstract":"In this paper a chipless RFID tag has been used to realized displacement measurements. Displacements of 100 μm can be monitored with this technique coming from chipless RFID. Tagged objects can thus be identified and their displacements can be monitored at the same time with accuracy of a few microns.","PeriodicalId":6481,"journal":{"name":"2017 IEEE MTT-S International Microwave Symposium (IMS)","volume":"12 1","pages":"605-608"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE MTT-S International Microwave Symposium (IMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.2017.8058640","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
In this paper a chipless RFID tag has been used to realized displacement measurements. Displacements of 100 μm can be monitored with this technique coming from chipless RFID. Tagged objects can thus be identified and their displacements can be monitored at the same time with accuracy of a few microns.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
