N. Espinosa, C. Vega, Jorge Alvarez, P. Leon, J. Vila
{"title":"Determination of rough microstructures on the surface of metals using the light scattering method in waveguides","authors":"N. Espinosa, C. Vega, Jorge Alvarez, P. Leon, J. Vila","doi":"10.1117/12.2526123","DOIUrl":null,"url":null,"abstract":"In this paper, we present the main results for the theoretical, numerical and experimental analysis of a new method to measure the roughness of metal surfaces. The requirements for a waveguide optical resonator, which is the main optical node of the device implementing this method, have been developed. A comparative analysis of two different designs of an optical node is performed. The energy spectra of the roughness of various surfaces were measured. As a result of the research, the main advantages of the method under consideration and practical recommendations are provided to improve the design of the device that implements this method.","PeriodicalId":10843,"journal":{"name":"Current Developments in Lens Design and Optical Engineering XX","volume":"17 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Current Developments in Lens Design and Optical Engineering XX","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2526123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, we present the main results for the theoretical, numerical and experimental analysis of a new method to measure the roughness of metal surfaces. The requirements for a waveguide optical resonator, which is the main optical node of the device implementing this method, have been developed. A comparative analysis of two different designs of an optical node is performed. The energy spectra of the roughness of various surfaces were measured. As a result of the research, the main advantages of the method under consideration and practical recommendations are provided to improve the design of the device that implements this method.