{"title":"From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?","authors":"L. Anghel, M. Nicolaidis, N. Buard","doi":"10.1109/IOLTS.2006.40","DOIUrl":null,"url":null,"abstract":"This panel will bring together a set of experts working in a collaborative project to address at both experimental measurement and simulations all levels of the process leading to system failures induced by soft errors. Several aspects will be discussed, e.g. interaction between energetic particles and the matter, detailed analysis of transient pulse generation and propagation, dependence of the circuit topology and system architecture.","PeriodicalId":6580,"journal":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"2 1","pages":"85"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2006.40","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This panel will bring together a set of experts working in a collaborative project to address at both experimental measurement and simulations all levels of the process leading to system failures induced by soft errors. Several aspects will be discussed, e.g. interaction between energetic particles and the matter, detailed analysis of transient pulse generation and propagation, dependence of the circuit topology and system architecture.
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