New Precision Jitter Measurement Solution on TMU -- Challenge on PRBS Reconstruction

Abstract

Jitter Measurement is an important part of High Speed test. With customer's test requirement rapidly growing, result only include RJ and DJ is not acceptable. The solution of test specific kinds of jitter (such as DDJ, DCD, ISI...) to verify the IC transform performance is strongly demanded by customers. So far, the industry of existing jitter measurement method include strobe method and Time-stamp method on TMU. However, the limitations are either complex or just measure several types of jitter. An industry leading solution of high accuracy jitter measurement by TMU directly sampling with new PRBS pattern reconstruction method is proposed in this paper. All types of jitter can be skillfully tested with the condition of no cost increase.