{"title":"X-ray topographic observation of polytype distributions in silicon carbide","authors":"W. J. Takei, M. Francombe","doi":"10.1088/0508-3443/18/11/312","DOIUrl":null,"url":null,"abstract":"An x-ray topographic technique has been used for the study of the spatial distribution of polytypes in silicon carbide crystals. The results for a typical mixed crystal indicate that analyses based upon the more conventional optical and x-ray Laue studies may be subject to misinterpretation. The topographic method clarifies the significance of the boundaries which are observed optically.","PeriodicalId":9350,"journal":{"name":"British Journal of Applied Physics","volume":"53 58 1","pages":"1589"},"PeriodicalIF":0.0000,"publicationDate":"1967-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"British Journal of Applied Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0508-3443/18/11/312","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
An x-ray topographic technique has been used for the study of the spatial distribution of polytypes in silicon carbide crystals. The results for a typical mixed crystal indicate that analyses based upon the more conventional optical and x-ray Laue studies may be subject to misinterpretation. The topographic method clarifies the significance of the boundaries which are observed optically.
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