{"title":"Film type solder mask evaluation for flip chip BGA","authors":"ChungJen Fu, D. Chang, C. Chen","doi":"10.1109/IMPACT.2009.5382163","DOIUrl":null,"url":null,"abstract":"In this paper, the effects of solder mask are studied and two types of solder mask are used in this study, include liquid type and dry film type. Ether liquid type or dry film type solder mask has its own advantage and disadvantage. For liquid type, it is a mature process and can be operated without vacuum environment. However, for dry film type, it needs to be operated in vacuum environment for preventing contamination and void, but dry film type could get better solder mask thickness uniformity and smaller roughness. The test vehicle of this study is 42.5mm*42.5mm Flip Chip Ball Grid Array (FCBGA) with 150um bump pitch composed with different solder mask material. Two kinds of substrate are evaluated in this study: liquid type solder mask (S/M1), dry film type solder mask (S/M2). Substrate roughness, adhesion test, PKG level coplanarity, PKG warpage and reliability test are conducted to evaluate the effect of dry film type and liquid type solder mask on substrate and PKG. The results shows that dry film type solder mask has lower roughness than liquid type. For the part of adhesion test between underfill and solder mask, dry film type solder mask shows similar adhesion strength to liquid type. Shadow moiré is employed to measure warpage and the results shows substrate with dry film solder mask has lower warpage. For the reliability life test, two packages are subjected to pre-condition of JEDEC MSL Level 3, TCT1000, HTSL1000 and HAST168, and both two packages passes reliability test.","PeriodicalId":6410,"journal":{"name":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","volume":"37 1","pages":"121-123"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMPACT.2009.5382163","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, the effects of solder mask are studied and two types of solder mask are used in this study, include liquid type and dry film type. Ether liquid type or dry film type solder mask has its own advantage and disadvantage. For liquid type, it is a mature process and can be operated without vacuum environment. However, for dry film type, it needs to be operated in vacuum environment for preventing contamination and void, but dry film type could get better solder mask thickness uniformity and smaller roughness. The test vehicle of this study is 42.5mm*42.5mm Flip Chip Ball Grid Array (FCBGA) with 150um bump pitch composed with different solder mask material. Two kinds of substrate are evaluated in this study: liquid type solder mask (S/M1), dry film type solder mask (S/M2). Substrate roughness, adhesion test, PKG level coplanarity, PKG warpage and reliability test are conducted to evaluate the effect of dry film type and liquid type solder mask on substrate and PKG. The results shows that dry film type solder mask has lower roughness than liquid type. For the part of adhesion test between underfill and solder mask, dry film type solder mask shows similar adhesion strength to liquid type. Shadow moiré is employed to measure warpage and the results shows substrate with dry film solder mask has lower warpage. For the reliability life test, two packages are subjected to pre-condition of JEDEC MSL Level 3, TCT1000, HTSL1000 and HAST168, and both two packages passes reliability test.
本文研究了阻焊剂的作用,采用了两种类型的阻焊剂,包括液体型和干膜型。醚液型或干膜型阻焊膜各有优缺点。对于液体型,它是一个成熟的工艺,可以在没有真空的环境下操作。而对于干膜型,为了防止污染和空隙,需要在真空环境下操作,而干膜型可以获得更好的阻焊厚度均匀性和更小的粗糙度。本研究的试验载体为42.5mm*42.5mm凸距150um的倒装芯片球栅阵列(FCBGA),由不同阻焊材料组成。本研究评估了两种衬底:液体型阻焊膜(S/M1)和干膜型阻焊膜(S/M2)。通过衬底粗糙度、附着力、PKG水平共面性、PKG挠曲度和可靠性试验,评价了干膜型和液体型阻焊剂对衬底和PKG的影响,结果表明,干膜型阻焊剂的粗糙度低于液体型阻焊剂。干膜型阻焊剂与液体型阻焊剂的附着强度相近。采用影模法测量翘曲量,结果表明采用干膜阻焊的基片翘曲量较低。在可靠性寿命测试中,两个封装分别经过JEDEC MSL Level 3、TCT1000、HTSL1000和HAST168的前置条件,两个封装均通过了可靠性测试。