{"title":"Algorithms for the analysis of ultrathin samples with terahertz time domain spectroscopy","authors":"M. Scheller, C. Jansen, M. Koch","doi":"10.1109/ICIMW.2009.5324656","DOIUrl":null,"url":null,"abstract":"We present a time domain and a frequency domain based algorithm for the analysis of spectroscopic terahertz data. The thickness information as well as the frequency dependent complex material parameters are extracted. Both methods can evaluate data obtained from measurements on sub-100µm thick samples, even in case of overlapping Fabry Perot echoes in the time domain. While the frequency domain approach provides highest accuracy, the time domain method is extremely computation efficient, enabling real time data extraction.","PeriodicalId":16181,"journal":{"name":"Journal of Infrared, Millimeter, and Terahertz Waves","volume":"50 1","pages":"1-2"},"PeriodicalIF":1.8000,"publicationDate":"2009-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Infrared, Millimeter, and Terahertz Waves","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/ICIMW.2009.5324656","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 1
Abstract
We present a time domain and a frequency domain based algorithm for the analysis of spectroscopic terahertz data. The thickness information as well as the frequency dependent complex material parameters are extracted. Both methods can evaluate data obtained from measurements on sub-100µm thick samples, even in case of overlapping Fabry Perot echoes in the time domain. While the frequency domain approach provides highest accuracy, the time domain method is extremely computation efficient, enabling real time data extraction.
期刊介绍：
The Journal of Infrared, Millimeter, and Terahertz Waves offers a peer-reviewed platform for the rapid dissemination of original, high-quality research in the frequency window from 30 GHz to 30 THz. The topics covered include: sources, detectors, and other devices; systems, spectroscopy, sensing, interaction between electromagnetic waves and matter, applications, metrology, and communications.
Purely numerical work, especially with commercial software packages, will be published only in very exceptional cases. The same applies to manuscripts describing only algorithms (e.g. pattern recognition algorithms).
Manuscripts submitted to the Journal should discuss a significant advancement to the field of infrared, millimeter, and terahertz waves.
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