A 50K devices/sec Real-Time RTN Analysis System for Technology Benchmarking

Chin-Hao Chang, Meng-Hsiu Wu, Meng-Hsien Tsai, Chiao-Yi Huang, C. Chao
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Abstract

Random Telegraph Noise (RTN) is a type of electronic noise that occurs in semiconductors and ultra-thin gate oxide films. RTN data acquisition and analysis require multiple measurements of millions of devices which is time consuming. This paper presents the design of a real-time RTN analysis system which achieved 17x speed boost with same accuracy by real-time processing noise data through DDR3 memory access. The designed system reduces the per wafer RTN analysis time from 5.5 hours to 0.33 hour.
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50K器件/秒实时RTN技术标杆分析系统
随机电报噪声(RTN)是发生在半导体和超薄栅氧化膜中的一种电子噪声。RTN数据采集和分析需要对数以百万计的设备进行多次测量,这非常耗时。本文设计了一种实时RTN分析系统,通过对DDR3存储器的访问,对噪声数据进行实时处理,在相同精度的情况下实现了17倍的速度提升。设计的系统将每个晶圆的RTN分析时间从5.5小时减少到0.33小时。
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