Local polarization in strontium barium niobate (SBN) epitaxial thin films investigated using Kelvin Force Microscopy (KFM)

M. Cuniot-Ponsard
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Abstract

The Kelvin Force Microscopy technique is exploited to obtain quantitative information on the local polarization dependences in strontium barium niobate epitaxial thin films.
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开尔文力显微镜(KFM)研究铌酸锶钡(SBN)外延薄膜的局部极化
利用开尔文力显微镜技术获得了铌酸锶钡外延薄膜局部极化依赖的定量信息。
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