Mona Feige, Stephan Schlamminger, Bryan Waltrip, Michael Berilla, Yicheng Wang
{"title":"Evaluations of a Detector-Limited Digital Impedance Bridge.","authors":"Mona Feige, Stephan Schlamminger, Bryan Waltrip, Michael Berilla, Yicheng Wang","doi":"10.6028/jres.126.006","DOIUrl":null,"url":null,"abstract":"<p><p>We tested a simple digital impedance bridge using two nominally equal resistors to form a 1:1 ratio. We focused on resolution and stability of the detectors. Fluctuations of the source voltages were largely removed through postprocessing of the digitized data, and the measurement results were limited by the detector noise. This detector-limited operating condition was first demonstrated using three modified Keysight 3458A multimeters for measurements of the voltage ratios, achieving 0.01 μV/V type A uncertainty in less than 15 min at 1 kHz. In an effort to extend the applicable frequency range and develop a system with off-the-shelf components, we tested a system using three lock-in detectors for measuring small deviations from the perfect AC ratio of unity magnitude, achieving stabilities and resolutions of 0.1 μV/V in a few hours for each point from 1 kHz to 5 kHz.</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"126 ","pages":"126006"},"PeriodicalIF":1.5000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC9681207/pdf/","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Research of the National Institute of Standards and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.6028/jres.126.006","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We tested a simple digital impedance bridge using two nominally equal resistors to form a 1:1 ratio. We focused on resolution and stability of the detectors. Fluctuations of the source voltages were largely removed through postprocessing of the digitized data, and the measurement results were limited by the detector noise. This detector-limited operating condition was first demonstrated using three modified Keysight 3458A multimeters for measurements of the voltage ratios, achieving 0.01 μV/V type A uncertainty in less than 15 min at 1 kHz. In an effort to extend the applicable frequency range and develop a system with off-the-shelf components, we tested a system using three lock-in detectors for measuring small deviations from the perfect AC ratio of unity magnitude, achieving stabilities and resolutions of 0.1 μV/V in a few hours for each point from 1 kHz to 5 kHz.
期刊介绍:
The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards.
In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research.
The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.