M. Krysztof, Paweł Miera, Paweł Urbański, T. Grzebyk
{"title":"集成硅电子源的高真空Mems器件","authors":"M. Krysztof, Paweł Miera, Paweł Urbański, T. Grzebyk","doi":"10.1109/IVNC57695.2023.10189018","DOIUrl":null,"url":null,"abstract":"The article presents a fabrication process and preliminary characterization of an integrated silicon electron source designed for High Vacuum MEMS (HVMEMS) devices, i.e., MEMS electron microscope, MEMS X-ray source. The electron source consists of a silicon tip emitter and a silicon gate electrode integrated on a single glass substrate, in a very close distance from each other. The source generates an electron beam without any carbon nanotube coverage, which was the case in the previous realization of the electron emitters.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Integrated Silicon Electron Source for High Vacuum Mems Devices\",\"authors\":\"M. Krysztof, Paweł Miera, Paweł Urbański, T. Grzebyk\",\"doi\":\"10.1109/IVNC57695.2023.10189018\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The article presents a fabrication process and preliminary characterization of an integrated silicon electron source designed for High Vacuum MEMS (HVMEMS) devices, i.e., MEMS electron microscope, MEMS X-ray source. The electron source consists of a silicon tip emitter and a silicon gate electrode integrated on a single glass substrate, in a very close distance from each other. The source generates an electron beam without any carbon nanotube coverage, which was the case in the previous realization of the electron emitters.\",\"PeriodicalId\":346266,\"journal\":{\"name\":\"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC57695.2023.10189018\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC57695.2023.10189018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Integrated Silicon Electron Source for High Vacuum Mems Devices
The article presents a fabrication process and preliminary characterization of an integrated silicon electron source designed for High Vacuum MEMS (HVMEMS) devices, i.e., MEMS electron microscope, MEMS X-ray source. The electron source consists of a silicon tip emitter and a silicon gate electrode integrated on a single glass substrate, in a very close distance from each other. The source generates an electron beam without any carbon nanotube coverage, which was the case in the previous realization of the electron emitters.