存储微电路测试程序设计与建模系统

2018 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2018-09-01 DOI:10.1109/EWDTS.2018.8524796

A. Melikov, A. Evdokimov, A. Shubovich, S. Volobuev

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引用次数: 2

摘要

提出了高性能存储器件故障检测自动化测试的设计技术和措施。通过对象和测试设备的算法和测试程序设计了仿真模型，节省了工程操作的人力。所设计的存储设备和诊断工具程序模型可用于高校和科研生产协会开发新的诊断系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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System of Designing Test Programs and Modeling of the Memory Microcircuits

There are suggested the high-performance memory device fault-detection automated test design techniques and measures. Simulation models allowing to save project operations labor have been designed by the algorithms and testing programs the object's and testing device's. The designed program model of memory device and diagnostic tools can be used in universities and scientific-production associations for developing new diagnostic systems.

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2018 IEEE East-West Design & Test Symposium (EWDTS)

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