先进的0.13um智能电源技术,从7V到70V

Hoon Chang, Jaejune Jang, Minhwan Kim, eung-Kyu Lee, D. Jang, Junsung Park, Jaehyeon Jung, Changjoon Yoon, Sung-Ryoul Bae, Chan Park
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引用次数: 24

摘要

本文提出了一种基于0.13um CMOS平台集成7V到70V功率器件的BCD工艺,用于各种电源管理应用。BJT,齐纳二极管和肖特基二极管可用,并嵌入非易失性存储器。LDMOS与BVDSS相比表现出同类最佳的特异性Ron (RSP)特性(即70V NMOS的RSP为69mΩ-mm2, BVDSS为89V)。采用模块化工艺方案,灵活适应各种应用要求。
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Advanced 0.13um smart power technology from 7V to 70V
This paper presents BCD process integrating 7V to 70V power devices on 0.13um CMOS platform for various power management applications. BJT, Zener diode and Schottky diode are available and non-volatile memory is embedded as well. LDMOS shows best-in-class specific Ron (RSP) vs. BVDSS characteristics (i.e., 70V NMOS has RSP of 69mΩ-mm2 with BVDSS of 89V). Modular process scheme is used for flexibility to various requirements of applications.
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Vertical leakage/breakdown mechanisms in AlGaN/GaN-on-Si structures Advanced 0.13um smart power technology from 7V to 70V Failure mechanisms of low-voltage trench power MOSFETs under repetitive avalanche conditions Destruction behavior of power diodes beyond the SOA limit Clamped inductive turn-off failure in high-voltage NPT-IGBTs under overloading conditions
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