数字LSI/VLSI系统的功能测试技术

21st Design Automation Conference Proceedings Pub Date : 1984-06-25 DOI:10.1109/DAC.1984.1585847

S. Su, Tonysheng Lin

{"title":"数字LSI/VLSI系统的功能测试技术","authors":"S. Su, Tonysheng Lin","doi":"10.1109/DAC.1984.1585847","DOIUrl":null,"url":null,"abstract":"Functional testing is becomilng more important due to the increasing complexity in digital LSI/VLSI devices. Various functional testing approaches have been proposed to meet this urgent need in LSI/VLSI testing. This paper presents the basic ideas behind deterministic functional testing and concisely overviews eight major functional testing techniques. Comparisons among these techniques and suggestions for future development are made to meet the challenges in this fast growing testing field.","PeriodicalId":188431,"journal":{"name":"21st Design Automation Conference Proceedings","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"38","resultStr":"{\"title\":\"Functional Testing Techniques for Digital LSI/VLSI Systems\",\"authors\":\"S. Su, Tonysheng Lin\",\"doi\":\"10.1109/DAC.1984.1585847\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Functional testing is becomilng more important due to the increasing complexity in digital LSI/VLSI devices. Various functional testing approaches have been proposed to meet this urgent need in LSI/VLSI testing. This paper presents the basic ideas behind deterministic functional testing and concisely overviews eight major functional testing techniques. Comparisons among these techniques and suggestions for future development are made to meet the challenges in this fast growing testing field.\",\"PeriodicalId\":188431,\"journal\":{\"name\":\"21st Design Automation Conference Proceedings\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1984-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"38\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st Design Automation Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1984.1585847\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Design Automation Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1984.1585847","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 38

摘要

由于数字LSI/VLSI器件日益复杂，功能测试变得越来越重要。为了满足大规模集成电路/超大规模集成电路测试的迫切需求，已经提出了各种功能测试方法。本文介绍了确定性功能测试背后的基本思想，并简要概述了八种主要的功能测试技术。对这些技术进行了比较，并对未来的发展提出了建议，以应对这一快速发展的测试领域所面临的挑战。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Functional Testing Techniques for Digital LSI/VLSI Systems

Functional testing is becomilng more important due to the increasing complexity in digital LSI/VLSI devices. Various functional testing approaches have been proposed to meet this urgent need in LSI/VLSI testing. This paper presents the basic ideas behind deterministic functional testing and concisely overviews eight major functional testing techniques. Comparisons among these techniques and suggestions for future development are made to meet the challenges in this fast growing testing field.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

21st Design Automation Conference Proceedings

自引率

0.00%

发文量

期刊最新文献

The Engineering Design Environment IGES as an Interchange Format for Integrated Circuit Design Functional Testing Techniques for Digital LSI/VLSI Systems Functional Design Verification by Multi-Level Simulation Uniform Support for Information Handling and Problem Solving Required by the VLSI Design Process