CalmRISC32的可测试性策略和DFT方法

Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434) Pub Date : 1900-01-01 DOI:10.1109/APASIC.2000.896966

Hong-Sik Kim, Il Seok Seo, Sungho Kang, G. Han

{"title":"CalmRISC32的可测试性策略和DFT方法","authors":"Hong-Sik Kim, Il Seok Seo, Sungho Kang, G. Han","doi":"10.1109/APASIC.2000.896966","DOIUrl":null,"url":null,"abstract":"This paper describes the test strategy and the DFT (Design for Testability) methodology of CalmRISC32. CalmRISC32 is a 32 bit microcontrol unit, which consists of a 32 bit IU core, an FPU and a Cache Unit. The embedded memory arrays are tested by memory BIST (Built-in Self Test) and the logic blocks are tested by functional test methodology at the instruction level. To increase the test efficiency, a new scan chain methodology using a module called a TSU (Test Scan Unit) is developed.","PeriodicalId":313978,"journal":{"name":"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Testability strategy and DFT methodology of CalmRISC32\",\"authors\":\"Hong-Sik Kim, Il Seok Seo, Sungho Kang, G. Han\",\"doi\":\"10.1109/APASIC.2000.896966\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the test strategy and the DFT (Design for Testability) methodology of CalmRISC32. CalmRISC32 is a 32 bit microcontrol unit, which consists of a 32 bit IU core, an FPU and a Cache Unit. The embedded memory arrays are tested by memory BIST (Built-in Self Test) and the logic blocks are tested by functional test methodology at the instruction level. To increase the test efficiency, a new scan chain methodology using a module called a TSU (Test Scan Unit) is developed.\",\"PeriodicalId\":313978,\"journal\":{\"name\":\"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)\",\"volume\":\"68 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APASIC.2000.896966\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APASIC.2000.896966","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文介绍了CalmRISC32的测试策略和可测试性设计(DFT)方法。CalmRISC32是一个32位微控制单元，由一个32位IU核、一个FPU和一个Cache单元组成。嵌入式存储器阵列采用存储器自检(BIST)测试，逻辑块采用指令级功能测试方法测试。为了提高测试效率，开发了一种新的扫描链方法，使用一个称为TSU(测试扫描单元)的模块。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Testability strategy and DFT methodology of CalmRISC32

This paper describes the test strategy and the DFT (Design for Testability) methodology of CalmRISC32. CalmRISC32 is a 32 bit microcontrol unit, which consists of a 32 bit IU core, an FPU and a Cache Unit. The embedded memory arrays are tested by memory BIST (Built-in Self Test) and the logic blocks are tested by functional test methodology at the instruction level. To increase the test efficiency, a new scan chain methodology using a module called a TSU (Test Scan Unit) is developed.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)

自引率

0.00%

发文量