演示具有100mrad总电离剂量耐受的全息存储器

Yoshizumi Ito, Minoru Watanabe, A. Ogiwara
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引用次数: 0

摘要

目前,空间系统需要高度耐辐射的存储器。如果具有高辐射耐受性的存储器可用,那么可以减少或取消用于空间的嵌入式系统的屏蔽,从而大大减少这种空间嵌入式系统的重量。本研究考察了全息存储器的抗辐射特性。利用钴60 γ辐射源,对光聚合物全息存储器进行了辐射实验。结果表明,在100mrad的总电离剂量下,全息记忆可以正常工作。全息存储器的耐辐射能力比电可擦可编程只读存储器(EEPROM)高300倍以上。此外,本文还展示了一个应用于光可重构门阵列的演示。配置过程可以利用辐射损伤全息存储器来实现。
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Demonstrating a holographic memory having 100 Mrad total-ionizing-dose tolerance
Currently, space systems require highly radiation tolerant memory. If memory with high radiation tolerance were available, then shielding of embedded systems for use in space could be reduced or removed, thereby greatly decreasing the weight of such space embedded systems. This study examines the radiation-hardened characteristics of a holographic memory. Using a cobalt 60 gamma radiation source, radiation experiments were conducted for a photopolymer holographic memory. Results show that the holographic memory can function correctly at a 100 Mrad total-ionizing dose. The radiation tolerance of the holographic memory is over 300 times higher than that of an electrically erasable programmable read-only memory (EEPROM). Moreover, this paper shows a demonstration applied for an optically reconfigurable gate array. The configuration procedure could be executed by using the radiation-damaged holographic memory.
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