{"title":"基于模拟和混合信号集成电路内置自检的重构结构解决方案","authors":"S. Mosin","doi":"10.1109/BEC.2010.5630220","DOIUrl":null,"url":null,"abstract":"The structural solution of built-in self test for analog and mixed-signal IC based on reconfiguring original circuit in oscillator has been proposed. The principles of functioning and main components of the solution have been considered. The experimental results for active filter have been shown.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Structural solution of reconfiguration based built-in self-test for analog and mixed-signal IC\",\"authors\":\"S. Mosin\",\"doi\":\"10.1109/BEC.2010.5630220\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The structural solution of built-in self test for analog and mixed-signal IC based on reconfiguring original circuit in oscillator has been proposed. The principles of functioning and main components of the solution have been considered. The experimental results for active filter have been shown.\",\"PeriodicalId\":228594,\"journal\":{\"name\":\"2010 12th Biennial Baltic Electronics Conference\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 12th Biennial Baltic Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BEC.2010.5630220\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 12th Biennial Baltic Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BEC.2010.5630220","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Structural solution of reconfiguration based built-in self-test for analog and mixed-signal IC
The structural solution of built-in self test for analog and mixed-signal IC based on reconfiguring original circuit in oscillator has been proposed. The principles of functioning and main components of the solution have been considered. The experimental results for active filter have been shown.
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