大功率led的PC板热管理

J. Yu, W. Oepts, H. Konijn
{"title":"大功率led的PC板热管理","authors":"J. Yu, W. Oepts, H. Konijn","doi":"10.1109/STHERM.2008.4509368","DOIUrl":null,"url":null,"abstract":"Increasing requirements of closely packed high power LEDs pose challenges for PC board thermal management. This paper presents a cost-effective thermal solution using FR4 based PCB technology and filled and capped vias. This robust technology enables superior thermal performance on board level for closely packed power LEDs. No solder joint or board level reliability failures were found during a temperature cycling test (TCT) from -40degC to 125degC after 1000 cycles. Moreover no solder joint and board level failure was found after 4000 cycles for open via FR4 when monitoring changes of board thermal resistance. Trade-offs are given for board thermal resistance versus packing density, various board designs, PCB technology, solder joint reliability and PCB board level reliability including open vias and filled and capped vias.","PeriodicalId":285718,"journal":{"name":"2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium","volume":"151 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"PC Board Thermal Management of High Power LEDs\",\"authors\":\"J. Yu, W. Oepts, H. Konijn\",\"doi\":\"10.1109/STHERM.2008.4509368\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Increasing requirements of closely packed high power LEDs pose challenges for PC board thermal management. This paper presents a cost-effective thermal solution using FR4 based PCB technology and filled and capped vias. This robust technology enables superior thermal performance on board level for closely packed power LEDs. No solder joint or board level reliability failures were found during a temperature cycling test (TCT) from -40degC to 125degC after 1000 cycles. Moreover no solder joint and board level failure was found after 4000 cycles for open via FR4 when monitoring changes of board thermal resistance. Trade-offs are given for board thermal resistance versus packing density, various board designs, PCB technology, solder joint reliability and PCB board level reliability including open vias and filled and capped vias.\",\"PeriodicalId\":285718,\"journal\":{\"name\":\"2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium\",\"volume\":\"151 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-03-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.2008.4509368\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Twenty-fourth Annual IEEE Semiconductor Thermal Measurement and Management Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.2008.4509368","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

摘要

对紧密封装的高功率led的需求不断增加,对PC板的热管理提出了挑战。本文提出了一种使用基于FR4的PCB技术和填充和封盖过孔的经济有效的热解决方案。这种强大的技术为紧密封装的功率led提供了优越的板级热性能。在温度循环测试(TCT)中,从-40摄氏度到125摄氏度,经过1000次循环,没有发现焊点或板级可靠性故障。此外,在监测板热阻变化时,通过FR4打开4000次后,没有发现焊点和板面失效。权衡电路板热阻与包装密度,各种电路板设计,PCB技术,焊点可靠性和PCB板级可靠性,包括开孔和填充和封盖孔。
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PC Board Thermal Management of High Power LEDs
Increasing requirements of closely packed high power LEDs pose challenges for PC board thermal management. This paper presents a cost-effective thermal solution using FR4 based PCB technology and filled and capped vias. This robust technology enables superior thermal performance on board level for closely packed power LEDs. No solder joint or board level reliability failures were found during a temperature cycling test (TCT) from -40degC to 125degC after 1000 cycles. Moreover no solder joint and board level failure was found after 4000 cycles for open via FR4 when monitoring changes of board thermal resistance. Trade-offs are given for board thermal resistance versus packing density, various board designs, PCB technology, solder joint reliability and PCB board level reliability including open vias and filled and capped vias.
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