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引用次数: 8

摘要

利用ANSYS软件建立了1206多层陶瓷电容器的有限元模型。采用断裂力学方法对构件可靠性进行了检验。研究了陶瓷端接界面由于焊料回流后的热冲击而产生的微裂纹,并估计了电路板弯曲过程中的断裂参数。基于陶瓷的脆性材料特性,可以认为陶瓷是一种理想的弹性材料,因此可以应用线弹性断裂力学。模拟计算的裂纹敏感区域和裂纹路径与MLCC弯曲试验中典型的裂纹扩展结果一致。
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A finite element modelling and fracture mechanical approach of Multilayer Ceramic Capacitors
A finite element model of a 1206 Multilayer Ceramic Capacitor (MLCC) has been developed using ANSYS. The component reliability is examined using a fracture mechanical approach. Micro cracks at the ceramic termination interface, due to thermal shock after solder reflow, are examined and fracture parameters during board flexing are estimated. Based on the brittle material behavior of ceramics, they can be considered as an ideal elastic material and so linear elastic fracture mechanics can be applied. The crack susceptible regions and calculated crack paths in the simulation agree with typically crack propagation observed in MLCC bending experiments.
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