{"title":"组合电路中的连接误差定位与校正","authors":"A. Wahba, D. Borrione","doi":"10.1109/EDTC.1997.582365","DOIUrl":null,"url":null,"abstract":"We present new diagnostic algorithms for localizing connection errors in combinational circuits. Three types of errors are considered: extra, missing, and bad connection errors. Special test patterns are generated to rapidly locate the error. The algorithms are integrated within the Prevail/sup TM/ system. Results on benchmarks show that the error is always located within a time proportional to the product of the circuit size, and the number of used patterns.","PeriodicalId":297301,"journal":{"name":"Proceedings European Design and Test Conference. ED & TC 97","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Connection error location and correction in combinational circuits\",\"authors\":\"A. Wahba, D. Borrione\",\"doi\":\"10.1109/EDTC.1997.582365\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present new diagnostic algorithms for localizing connection errors in combinational circuits. Three types of errors are considered: extra, missing, and bad connection errors. Special test patterns are generated to rapidly locate the error. The algorithms are integrated within the Prevail/sup TM/ system. Results on benchmarks show that the error is always located within a time proportional to the product of the circuit size, and the number of used patterns.\",\"PeriodicalId\":297301,\"journal\":{\"name\":\"Proceedings European Design and Test Conference. ED & TC 97\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings European Design and Test Conference. ED & TC 97\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTC.1997.582365\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings European Design and Test Conference. ED & TC 97","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1997.582365","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Connection error location and correction in combinational circuits
We present new diagnostic algorithms for localizing connection errors in combinational circuits. Three types of errors are considered: extra, missing, and bad connection errors. Special test patterns are generated to rapidly locate the error. The algorithms are integrated within the Prevail/sup TM/ system. Results on benchmarks show that the error is always located within a time proportional to the product of the circuit size, and the number of used patterns.
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