Gang Huang, M. Bakir, A. Naeemi, H. Chen, J. Meindl
{"title":"三维芯片堆栈的功率传输:物理建模和设计含义","authors":"Gang Huang, M. Bakir, A. Naeemi, H. Chen, J. Meindl","doi":"10.1109/EPEP.2007.4387161","DOIUrl":null,"url":null,"abstract":"Three-dimensional (3D) integration creates vast opportunities to improve performance and the level of integration in nanoelectronic systems. However, 3D integration presents many challenges for power delivery network design due to larger supply currents and longer power delivery paths compared to 2D systems. In this paper, an analytical physical model is derived to incorporate the impact of 3D-integration on power supply noise. The model has less than 4% error compared to SPICE simulations. Based on the model, design guidelines and opportunities for reducing power supply noise, such as inserting \"decap\" die and through-vias, are discussed in this paper.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"145","resultStr":"{\"title\":\"Power Delivery for 3D Chip Stacks: Physical Modeling and Design Implication\",\"authors\":\"Gang Huang, M. Bakir, A. Naeemi, H. Chen, J. Meindl\",\"doi\":\"10.1109/EPEP.2007.4387161\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Three-dimensional (3D) integration creates vast opportunities to improve performance and the level of integration in nanoelectronic systems. However, 3D integration presents many challenges for power delivery network design due to larger supply currents and longer power delivery paths compared to 2D systems. In this paper, an analytical physical model is derived to incorporate the impact of 3D-integration on power supply noise. The model has less than 4% error compared to SPICE simulations. Based on the model, design guidelines and opportunities for reducing power supply noise, such as inserting \\\"decap\\\" die and through-vias, are discussed in this paper.\",\"PeriodicalId\":402571,\"journal\":{\"name\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"145\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2007.4387161\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2007.4387161","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Power Delivery for 3D Chip Stacks: Physical Modeling and Design Implication
Three-dimensional (3D) integration creates vast opportunities to improve performance and the level of integration in nanoelectronic systems. However, 3D integration presents many challenges for power delivery network design due to larger supply currents and longer power delivery paths compared to 2D systems. In this paper, an analytical physical model is derived to incorporate the impact of 3D-integration on power supply noise. The model has less than 4% error compared to SPICE simulations. Based on the model, design guidelines and opportunities for reducing power supply noise, such as inserting "decap" die and through-vias, are discussed in this paper.