先进的ATE波形生成技术

C. Ziomek, E. S. Jones
{"title":"先进的ATE波形生成技术","authors":"C. Ziomek, E. S. Jones","doi":"10.1109/AUTEST.2009.5314045","DOIUrl":null,"url":null,"abstract":"Comprehensive waveform generation is an important functional component of automated test equipment (ATE). Waveform generators synthesize signal stimuli to be applied to a device under test (DUT). As military and commercial electronics become increasingly complex, more sophisticated signal stimuli are required. ATE requires signal stimuli varying from advanced communication signals to the playback of captured real-world analog signals. Waveform generators can synthesize signals that can be broadly categorized into four types: standard functions, advanced functions, arbitrary waveforms, and waveform sequences. Standard functions include the simple sine, square, triangle, pulse, and ramp waveforms. Advanced functions include complex signals such as multi-tone, AM, FM, sinc pulse, haversine, half-cycle sine, Gaussian pulse, Lorentz pulse, noise and others. Arbitrary waveforms involve the point-by-point user-defined waveform synthesis. Waveform sequences provide a mechanism to piece together standard or arbitrary waveforms in stages to create a user-defined compound waveform. Example applications for each of these four waveform categories are described in this paper. Modern waveform generators are extremely powerful, but can also add significant complexity for the user. The arbitrary waveform generator, an instrument found in most ATE systems, is a very powerful signal synthesis tool. Unfortunately, many users take advantage of only a small fraction of the powerful features available to them in an arbitrary waveform generator. Also, selecting the right arbitrary waveform generator can be daunting when comparing specifications such as DAC resolution, clock rates and topology, memory depth, sequencing, sweeping, triggering and synchronization. This paper describes the technical differences between various signal generation techniques, presents the signal fidelity impact of clock topology, discusses dynamic range limitations due to noise, accuracy and resolution, and provides typical applications to illustrate signal generation usage. Ultimately, this information should help the user avoid common pitfalls in applying waveform generators within ATE.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Advanced waveform generation techniques for ATE\",\"authors\":\"C. Ziomek, E. S. Jones\",\"doi\":\"10.1109/AUTEST.2009.5314045\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Comprehensive waveform generation is an important functional component of automated test equipment (ATE). Waveform generators synthesize signal stimuli to be applied to a device under test (DUT). As military and commercial electronics become increasingly complex, more sophisticated signal stimuli are required. ATE requires signal stimuli varying from advanced communication signals to the playback of captured real-world analog signals. Waveform generators can synthesize signals that can be broadly categorized into four types: standard functions, advanced functions, arbitrary waveforms, and waveform sequences. Standard functions include the simple sine, square, triangle, pulse, and ramp waveforms. Advanced functions include complex signals such as multi-tone, AM, FM, sinc pulse, haversine, half-cycle sine, Gaussian pulse, Lorentz pulse, noise and others. Arbitrary waveforms involve the point-by-point user-defined waveform synthesis. Waveform sequences provide a mechanism to piece together standard or arbitrary waveforms in stages to create a user-defined compound waveform. Example applications for each of these four waveform categories are described in this paper. Modern waveform generators are extremely powerful, but can also add significant complexity for the user. The arbitrary waveform generator, an instrument found in most ATE systems, is a very powerful signal synthesis tool. Unfortunately, many users take advantage of only a small fraction of the powerful features available to them in an arbitrary waveform generator. Also, selecting the right arbitrary waveform generator can be daunting when comparing specifications such as DAC resolution, clock rates and topology, memory depth, sequencing, sweeping, triggering and synchronization. This paper describes the technical differences between various signal generation techniques, presents the signal fidelity impact of clock topology, discusses dynamic range limitations due to noise, accuracy and resolution, and provides typical applications to illustrate signal generation usage. Ultimately, this information should help the user avoid common pitfalls in applying waveform generators within ATE.\",\"PeriodicalId\":187421,\"journal\":{\"name\":\"2009 IEEE AUTOTESTCON\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2009.5314045\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314045","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

综合波形生成是自动化测试设备的重要功能组成部分。波形发生器合成用于被测设备(DUT)的信号刺激。随着军事和商业电子变得越来越复杂,需要更复杂的信号刺激。ATE需要各种信号刺激,从高级通信信号到捕获的真实世界模拟信号的回放。波形发生器可以合成的信号大致可以分为四种类型:标准函数、高级函数、任意波形和波形序列。标准函数包括简单的正弦,方形,三角形,脉冲和斜坡波形。高级功能包括复杂信号,如多音,AM, FM,正弦脉冲,哈弗辛,半周正弦,高斯脉冲,洛伦兹脉冲,噪声等。任意波形包括逐点用户定义的波形合成。波形序列提供了一种机制,将标准或任意波形分阶段拼接在一起,以创建用户定义的复合波形。本文描述了这四种波形类别中的每一种的示例应用。现代波形发生器非常强大,但也可能为用户增加显著的复杂性。任意波形发生器是一种非常强大的信号合成工具,在大多数ATE系统中都可以找到。不幸的是,许多用户只利用了任意波形发生器中可用功能的一小部分。此外,在比较DAC分辨率、时钟速率和拓扑结构、内存深度、排序、扫描、触发和同步等规格时,选择合适的任意波形发生器可能会令人望而生畏。本文描述了各种信号生成技术之间的技术差异,介绍了时钟拓扑对信号保真度的影响,讨论了噪声、精度和分辨率对动态范围的限制,并提供了典型的应用来说明信号生成的使用。最终,这些信息将帮助用户避免在ATE中应用波形发生器时的常见缺陷。
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Advanced waveform generation techniques for ATE
Comprehensive waveform generation is an important functional component of automated test equipment (ATE). Waveform generators synthesize signal stimuli to be applied to a device under test (DUT). As military and commercial electronics become increasingly complex, more sophisticated signal stimuli are required. ATE requires signal stimuli varying from advanced communication signals to the playback of captured real-world analog signals. Waveform generators can synthesize signals that can be broadly categorized into four types: standard functions, advanced functions, arbitrary waveforms, and waveform sequences. Standard functions include the simple sine, square, triangle, pulse, and ramp waveforms. Advanced functions include complex signals such as multi-tone, AM, FM, sinc pulse, haversine, half-cycle sine, Gaussian pulse, Lorentz pulse, noise and others. Arbitrary waveforms involve the point-by-point user-defined waveform synthesis. Waveform sequences provide a mechanism to piece together standard or arbitrary waveforms in stages to create a user-defined compound waveform. Example applications for each of these four waveform categories are described in this paper. Modern waveform generators are extremely powerful, but can also add significant complexity for the user. The arbitrary waveform generator, an instrument found in most ATE systems, is a very powerful signal synthesis tool. Unfortunately, many users take advantage of only a small fraction of the powerful features available to them in an arbitrary waveform generator. Also, selecting the right arbitrary waveform generator can be daunting when comparing specifications such as DAC resolution, clock rates and topology, memory depth, sequencing, sweeping, triggering and synchronization. This paper describes the technical differences between various signal generation techniques, presents the signal fidelity impact of clock topology, discusses dynamic range limitations due to noise, accuracy and resolution, and provides typical applications to illustrate signal generation usage. Ultimately, this information should help the user avoid common pitfalls in applying waveform generators within ATE.
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