{"title":"基于统计的可测性分析方法","authors":"C. Chiou, Chun-Yao Wang, Yung-Chih Chen","doi":"10.1109/ISQED.2008.89","DOIUrl":null,"url":null,"abstract":"This paper presents a statistic-based approach for evaluating the testability of nodes in combinational circuits. This testability measurement is obtained via Monte Carlo simulation governed by the formulated Monte Carlo model. The Monte Carlo simulation is terminated when the predefined error with respect to the Monte Carlo model, under a specified confidence level, is achieved. We conduct the experiments on a set of ISCAS '85 and MCNC benchmarks. As compared with previous work, our approach more efficiently evaluates the testability with less error rate.","PeriodicalId":243121,"journal":{"name":"9th International Symposium on Quality Electronic Design (isqed 2008)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A Statistic-Based Approach to Testability Analysis\",\"authors\":\"C. Chiou, Chun-Yao Wang, Yung-Chih Chen\",\"doi\":\"10.1109/ISQED.2008.89\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a statistic-based approach for evaluating the testability of nodes in combinational circuits. This testability measurement is obtained via Monte Carlo simulation governed by the formulated Monte Carlo model. The Monte Carlo simulation is terminated when the predefined error with respect to the Monte Carlo model, under a specified confidence level, is achieved. We conduct the experiments on a set of ISCAS '85 and MCNC benchmarks. As compared with previous work, our approach more efficiently evaluates the testability with less error rate.\",\"PeriodicalId\":243121,\"journal\":{\"name\":\"9th International Symposium on Quality Electronic Design (isqed 2008)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"9th International Symposium on Quality Electronic Design (isqed 2008)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2008.89\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"9th International Symposium on Quality Electronic Design (isqed 2008)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2008.89","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Statistic-Based Approach to Testability Analysis
This paper presents a statistic-based approach for evaluating the testability of nodes in combinational circuits. This testability measurement is obtained via Monte Carlo simulation governed by the formulated Monte Carlo model. The Monte Carlo simulation is terminated when the predefined error with respect to the Monte Carlo model, under a specified confidence level, is achieved. We conduct the experiments on a set of ISCAS '85 and MCNC benchmarks. As compared with previous work, our approach more efficiently evaluates the testability with less error rate.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
