P. Fernandez-Martínez, L. Ré, D. Flores, S. Hidalgo, D. Quirion, M. Ullán
{"title":"一种用于ATLAS升级内跟踪器供电方案的新型垂直场效应晶体管技术","authors":"P. Fernandez-Martínez, L. Ré, D. Flores, S. Hidalgo, D. Quirion, M. Ullán","doi":"10.1109/NSSMIC.2016.8069654","DOIUrl":null,"url":null,"abstract":"The IMB-CNM (Barcelona) has developed a new vertical JFET (V-JFET) technology with the purpose of working as rad-hard switches in the HV powering scheme of the upgraded ATLAS tracker. The design of the new transistors draws upon a deep-trenched 3D technology to achieve vertical conduction and low switch-off voltage. These features prospect suitable radiation hardness for the application. The first V-JFET prototypes are now fabricated and characterized, with very promising results already meeting the application requirements. A compilation of the simulated and measured performance is shown in the contribution. To evaluate the radiation hardness, gamma irradiation has been performed and the main results are presented here.","PeriodicalId":184587,"journal":{"name":"2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A new vertical JFET technology for the powering scheme of the ATLAS upgrade inner tracker\",\"authors\":\"P. Fernandez-Martínez, L. Ré, D. Flores, S. Hidalgo, D. Quirion, M. Ullán\",\"doi\":\"10.1109/NSSMIC.2016.8069654\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The IMB-CNM (Barcelona) has developed a new vertical JFET (V-JFET) technology with the purpose of working as rad-hard switches in the HV powering scheme of the upgraded ATLAS tracker. The design of the new transistors draws upon a deep-trenched 3D technology to achieve vertical conduction and low switch-off voltage. These features prospect suitable radiation hardness for the application. The first V-JFET prototypes are now fabricated and characterized, with very promising results already meeting the application requirements. A compilation of the simulated and measured performance is shown in the contribution. To evaluate the radiation hardness, gamma irradiation has been performed and the main results are presented here.\",\"PeriodicalId\":184587,\"journal\":{\"name\":\"2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSSMIC.2016.8069654\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSSMIC.2016.8069654","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new vertical JFET technology for the powering scheme of the ATLAS upgrade inner tracker
The IMB-CNM (Barcelona) has developed a new vertical JFET (V-JFET) technology with the purpose of working as rad-hard switches in the HV powering scheme of the upgraded ATLAS tracker. The design of the new transistors draws upon a deep-trenched 3D technology to achieve vertical conduction and low switch-off voltage. These features prospect suitable radiation hardness for the application. The first V-JFET prototypes are now fabricated and characterized, with very promising results already meeting the application requirements. A compilation of the simulated and measured performance is shown in the contribution. To evaluate the radiation hardness, gamma irradiation has been performed and the main results are presented here.