多层感知器的发展,以识别塑料荧光寿命成像显微镜

Georgekutty Jose Maniyattu, Eldho Geegy, M. Wohlschläger, N. Leiter, M. Versen, C. Laforsch
{"title":"多层感知器的发展,以识别塑料荧光寿命成像显微镜","authors":"Georgekutty Jose Maniyattu, Eldho Geegy, M. Wohlschläger, N. Leiter, M. Versen, C. Laforsch","doi":"10.31399/asm.edfa.2023-3.p031","DOIUrl":null,"url":null,"abstract":"\n Existing plastic analysis techniques such as Fourier transform infrared spectroscopy and Raman spectroscopy are problematic because samples must be anhydrous and identification can be hindered by additives. This article describes a new approach that has been successfully demonstrated in which plastics can be classified by neural networks that are trained, validated, and tested by frequency domain fluorescence lifetime imaging microscopy measurements.","PeriodicalId":431761,"journal":{"name":"EDFA Technical Articles","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Multilayer Perceptron Development to Identify Plastics Using Fluorescence Lifetime Imaging Microscopy\",\"authors\":\"Georgekutty Jose Maniyattu, Eldho Geegy, M. Wohlschläger, N. Leiter, M. Versen, C. Laforsch\",\"doi\":\"10.31399/asm.edfa.2023-3.p031\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n Existing plastic analysis techniques such as Fourier transform infrared spectroscopy and Raman spectroscopy are problematic because samples must be anhydrous and identification can be hindered by additives. This article describes a new approach that has been successfully demonstrated in which plastics can be classified by neural networks that are trained, validated, and tested by frequency domain fluorescence lifetime imaging microscopy measurements.\",\"PeriodicalId\":431761,\"journal\":{\"name\":\"EDFA Technical Articles\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"EDFA Technical Articles\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.edfa.2023-3.p031\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"EDFA Technical Articles","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.edfa.2023-3.p031","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

现有的塑料分析技术,如傅里叶变换红外光谱和拉曼光谱是有问题的,因为样品必须是无水的,鉴定可能会受到添加剂的阻碍。本文描述了一种新的方法,已经成功地证明了塑料可以通过神经网络进行分类,这些神经网络经过训练,验证,并通过频域荧光寿命成像显微镜测量进行测试。
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Multilayer Perceptron Development to Identify Plastics Using Fluorescence Lifetime Imaging Microscopy
Existing plastic analysis techniques such as Fourier transform infrared spectroscopy and Raman spectroscopy are problematic because samples must be anhydrous and identification can be hindered by additives. This article describes a new approach that has been successfully demonstrated in which plastics can be classified by neural networks that are trained, validated, and tested by frequency domain fluorescence lifetime imaging microscopy measurements.
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