{"title":"嵌入式硅扇出晶圆级封装的电学、热学和机械模拟","authors":"Cheng Chen, Daquan Yu, L. Wan","doi":"10.1109/CICTA.2018.8706049","DOIUrl":null,"url":null,"abstract":"A novel embedded silicon fan-out wafer level packaging (eSiFO), which was proposed by Huatian Technology in 2015 and now in production, has a relatively simple manufacturing process eliminating molding and de-bonding process compared to typical fan-out process. This paper briefly introduces eSiFO technology at first, and then mainly studies its electrical and thermal performance, as well as RDL reliability. This study finds that eSiFO technology has a good package performance, and can further provide optimal performance for mobile electronics and potential IoT and 5G applications.","PeriodicalId":186840,"journal":{"name":"2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Electrical, Thermal and Mechanical Simulation for Embedded Silicon Fan-out Wafer Level Packaging\",\"authors\":\"Cheng Chen, Daquan Yu, L. Wan\",\"doi\":\"10.1109/CICTA.2018.8706049\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel embedded silicon fan-out wafer level packaging (eSiFO), which was proposed by Huatian Technology in 2015 and now in production, has a relatively simple manufacturing process eliminating molding and de-bonding process compared to typical fan-out process. This paper briefly introduces eSiFO technology at first, and then mainly studies its electrical and thermal performance, as well as RDL reliability. This study finds that eSiFO technology has a good package performance, and can further provide optimal performance for mobile electronics and potential IoT and 5G applications.\",\"PeriodicalId\":186840,\"journal\":{\"name\":\"2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICTA.2018.8706049\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICTA.2018.8706049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electrical, Thermal and Mechanical Simulation for Embedded Silicon Fan-out Wafer Level Packaging
A novel embedded silicon fan-out wafer level packaging (eSiFO), which was proposed by Huatian Technology in 2015 and now in production, has a relatively simple manufacturing process eliminating molding and de-bonding process compared to typical fan-out process. This paper briefly introduces eSiFO technology at first, and then mainly studies its electrical and thermal performance, as well as RDL reliability. This study finds that eSiFO technology has a good package performance, and can further provide optimal performance for mobile electronics and potential IoT and 5G applications.