119导联塑料球栅阵列散热片贴装方法及其对封装结构完整性和互连可靠性影响的研究

L. Eyman, G. Kromann
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引用次数: 10

摘要

对市面上可用于高性能119导联塑料球栅阵列(PBGA)封装的各种散热器和附加方法进行了实验研究。本研究研究的粘接方法包括压敏胶、机械夹和导热胶。本研究将显示散热片贴装方式对封装结构完整性和焊球互连可靠性的影响。为了更好地为需要从该封装中消耗高功率的客户提供整体解决方案,这项工作是必要的。散热器安装在多层印刷电路板上的119引脚PBGA封装上。然后,这些组件进行加速寿命测试(ALT),使用0/spl℃至100/spl℃之间的空气对空气热循环,以确定将散热器附加到封装上对焊点连接电气可靠性的影响。除了互连可靠性外,ALT还用于确定热循环对散热器连接机构可靠性的影响。采用三种不同的方法对散热器的附着机构进行了测试。第一个是简单地观察散热片,看它们是否在热循环过程中脱落。然后使用包装跌落测试仪进行机械冲击试验。进行了1000、2000和11400次热循环以及不进行热循环的样品进行了该测试。最后,采用恒应变率机械试验机对粘接散热片的包装进行剪切强度试验。实验中出现了几种失效模式。这些故障包括热循环中互连寿命极低,跌落测试和热循环过程中散热器脱落,剪切测试中粘附强度低。虽然有些连接方法显然不合适,但其他方法为散热器连接问题提供了可靠的解决方案。
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Investigation of heat sink attach methodologies and the effects on package structural integrity and interconnect reliability of the 119-lead plastic ball grid array
An experimental study was performed to investigate various heat sinks and attach methods commercially available for the high-performance 119-lead plastic ball grid array (PBGA) package. Attach methods investigated in this study include a pressure-sensitive adhesive, mechanical clips, and thermally conductive adhesives. This work will show the effects of heat sink attach methods on the package structural integrity and solder ball interconnect reliability. This work is necessary to better provide total solutions for customers who will need to dissipate high levels of power from this package. The heat sinks were attached to the 119-lead PBGA packages which were mounted on multi-layer printed-circuit boards. These assemblies were then subjected to accelerated-life testing (ALT) using air-to-air thermal cycling between 0/spl deg/C and 100/spl deg/C to determine the effect of attaching heat sinks to the packages on the electrical reliability of the solder joint connection. Besides interconnect reliability, ALT was used to determine the effect of thermal cycling on the reliability of the heat sink attach mechanism. The heat sink attach mechanisms were tested by three different methods. The first was to simply observe the heat sinks to see if they fall off during thermal cycling. Mechanical shock tests then were performed using a package drop tester. Samples that underwent 1000, 2000, and 11400 thermal cycles, as well as no thermal cycling, were subjected to this test. Finally, shear strength tests using a constant strain-rate mechanical testing machine were performed on the packages with heat sinks attached using adhesives. Several modes of failure appeared in the experiments. These failures included extremely low interconnect life in thermal cycling, heat sink detachment during drop tests and during thermal cycling, and low adhesion strength in shear tests. While some attachment methods were obviously not suitable, others provided robust solutions to the heat sink attachment problem.
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