S. Blonkowski, T. Cabout, M. Azazz, C. Cagli, E. Jalaguier
{"title":"基于焦耳加热和电迁移的直流和脉冲工作OxRAM全解析紧凑模型","authors":"S. Blonkowski, T. Cabout, M. Azazz, C. Cagli, E. Jalaguier","doi":"10.1109/IMW.2016.7495270","DOIUrl":null,"url":null,"abstract":"A totally analytic compact model of bipolar switching in oxide based resistive memory is reported. Analytical expressions reproducing the switching in the case of ramp voltage and short voltage pulses without any iterative procedure are given. The model results are compared to experimental data and to a numerical model containing the same physical basis.","PeriodicalId":365759,"journal":{"name":"2016 IEEE 8th International Memory Workshop (IMW)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fully Analytical Compact Model of OxRAM Based on Joule Heating and Electromigration for DC and Pulsed Operation\",\"authors\":\"S. Blonkowski, T. Cabout, M. Azazz, C. Cagli, E. Jalaguier\",\"doi\":\"10.1109/IMW.2016.7495270\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A totally analytic compact model of bipolar switching in oxide based resistive memory is reported. Analytical expressions reproducing the switching in the case of ramp voltage and short voltage pulses without any iterative procedure are given. The model results are compared to experimental data and to a numerical model containing the same physical basis.\",\"PeriodicalId\":365759,\"journal\":{\"name\":\"2016 IEEE 8th International Memory Workshop (IMW)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 8th International Memory Workshop (IMW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMW.2016.7495270\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 8th International Memory Workshop (IMW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2016.7495270","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fully Analytical Compact Model of OxRAM Based on Joule Heating and Electromigration for DC and Pulsed Operation
A totally analytic compact model of bipolar switching in oxide based resistive memory is reported. Analytical expressions reproducing the switching in the case of ramp voltage and short voltage pulses without any iterative procedure are given. The model results are compared to experimental data and to a numerical model containing the same physical basis.