{"title":"阶跃应力在时间相关击穿中的应用","authors":"E. S. Anolick, Li-Yu Chen","doi":"10.1109/IRPS.1981.362967","DOIUrl":null,"url":null,"abstract":"A method of speeding up testing by step stressing is described. The mathematic models utilized, the theoretical and experimental results, and application to final failure rate estimates are shown.","PeriodicalId":376954,"journal":{"name":"19th International Reliability Physics Symposium","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Application of Step Stress to Time Dependent Breakdown\",\"authors\":\"E. S. Anolick, Li-Yu Chen\",\"doi\":\"10.1109/IRPS.1981.362967\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method of speeding up testing by step stressing is described. The mathematic models utilized, the theoretical and experimental results, and application to final failure rate estimates are shown.\",\"PeriodicalId\":376954,\"journal\":{\"name\":\"19th International Reliability Physics Symposium\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1981-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"19th International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.1981.362967\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1981.362967","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application of Step Stress to Time Dependent Breakdown
A method of speeding up testing by step stressing is described. The mathematic models utilized, the theoretical and experimental results, and application to final failure rate estimates are shown.