{"title":"模式敏感故障检测的最优内存地址种子","authors":"S. Yarmolik, B. Sokol","doi":"10.1109/DDECS.2006.1649616","DOIUrl":null,"url":null,"abstract":"The goal of this paper is to propose a new technique for memory testing based on transparent memory march tests (van de Goor, 1991 and Nicolaidis, 1996). This paper deals with memory pattern sensitive faults detection problem. It shows the efficiency of multiple runs of march tests for memory passive pattern sensitive faults detection and analyzes the optimal address seeds for multiple march test runs. This paper provides only short fragment of carried researches. All results can be found in extended version of this paper","PeriodicalId":158707,"journal":{"name":"2006 IEEE Design and Diagnostics of Electronic Circuits and systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Optimal Memory Address Seeds for Pattern Sensitive Faults Detection\",\"authors\":\"S. Yarmolik, B. Sokol\",\"doi\":\"10.1109/DDECS.2006.1649616\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The goal of this paper is to propose a new technique for memory testing based on transparent memory march tests (van de Goor, 1991 and Nicolaidis, 1996). This paper deals with memory pattern sensitive faults detection problem. It shows the efficiency of multiple runs of march tests for memory passive pattern sensitive faults detection and analyzes the optimal address seeds for multiple march test runs. This paper provides only short fragment of carried researches. All results can be found in extended version of this paper\",\"PeriodicalId\":158707,\"journal\":{\"name\":\"2006 IEEE Design and Diagnostics of Electronic Circuits and systems\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-04-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 IEEE Design and Diagnostics of Electronic Circuits and systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2006.1649616\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE Design and Diagnostics of Electronic Circuits and systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2006.1649616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
摘要
本文的目的是提出一种基于透明记忆行军测试的记忆测试新技术(van de Goor, 1991和Nicolaidis, 1996)。本文研究了记忆模式敏感故障检测问题。展示了多次行军测试对内存被动模式敏感故障检测的效率，并分析了多次行军测试的最优地址种子。本文只提供了所进行研究的一小部分。所有结果都可以在本文的扩展版中找到
Optimal Memory Address Seeds for Pattern Sensitive Faults Detection
The goal of this paper is to propose a new technique for memory testing based on transparent memory march tests (van de Goor, 1991 and Nicolaidis, 1996). This paper deals with memory pattern sensitive faults detection problem. It shows the efficiency of multiple runs of march tests for memory passive pattern sensitive faults detection and analyzes the optimal address seeds for multiple march test runs. This paper provides only short fragment of carried researches. All results can be found in extended version of this paper
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