{"title":"改进了检验表列s参数因果关系的程序","authors":"S. Lalgudi, S. Asgari, M. Tsuk","doi":"10.1109/EPEPS.2012.6457874","DOIUrl":null,"url":null,"abstract":"Tabulated S-parameters are often tested for causality to ensure successful transient simulation. Existing approaches for this test either are not robust or have limited resolution in detecting noncausality. In this paper, a new approach for this test is proposed. The proposed approach is more robust and has better resolution than existing approaches.","PeriodicalId":188377,"journal":{"name":"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Improved procedure to test causality of tabulated S-parameters\",\"authors\":\"S. Lalgudi, S. Asgari, M. Tsuk\",\"doi\":\"10.1109/EPEPS.2012.6457874\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Tabulated S-parameters are often tested for causality to ensure successful transient simulation. Existing approaches for this test either are not robust or have limited resolution in detecting noncausality. In this paper, a new approach for this test is proposed. The proposed approach is more robust and has better resolution than existing approaches.\",\"PeriodicalId\":188377,\"journal\":{\"name\":\"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2012.6457874\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2012.6457874","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improved procedure to test causality of tabulated S-parameters
Tabulated S-parameters are often tested for causality to ensure successful transient simulation. Existing approaches for this test either are not robust or have limited resolution in detecting noncausality. In this paper, a new approach for this test is proposed. The proposed approach is more robust and has better resolution than existing approaches.
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